Markus, Antti (autor)

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  • artikkel kogumikus
    Assembling low-level tests to high-level symbolic test framesJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings [of the] 15th NORCHIP Conference, Tallinn, 10-11 November 19971997 / p. 275-280: ill
    artikkel kogumikus
  • artikkel kogumikus
    Automatic test generation system for VLSIJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 19971997 / p. 255-258
    artikkel kogumikus
  • artikkel kogumikus
    CAD software for digital test and diagnosticsJervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesProceedings of International Conference on Design and Diagnostics of Electronic Circuits and Systems, Ostrava, Czech Republik, May 12-14, 19971997 / p. 35-40
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    DECIDER : a decision diagram based hierarchical test generation systemJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Szczyrk, Poland, September 2-4, 19981998 / p. 269-273
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    A decision diagram based hierarchical test pattern generatorJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 159-162: ill
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    Fast and efficient static compaction of test sequences using bipartite graph representationsMarkus, Antti; Raik, Jaan; Ubar, Raimund-JohannesECS'99 : proceedings of the 2nd Electronic Circuits and Systems Conference : September 6-8, 1999, Bratislava, Slovakia1999 / p. 17-20
    artikkel kogumikus
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    Fault model and test synthesis for RISC-processorsUbar, Raimund-Johannes; Markus, Antti; Jervan, Gert; Raik, JaanBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 229-232: ill
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    A hierarchical automatic test pattern generator based on using alternative graphsBrik, Marina; Jervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 19971997 / p. 415-420
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    Hierarchical test generation for digital systemsBrik, Marina; Jervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesMixed design of integrated circuits and systems1998 / p. 131-136: ill
    artikkel kogumikus
  • artikkel kogumikus
    Hierarchical test generation with multi-level decision diagram modelsJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 19981998 / p. 26-33
    artikkel kogumikus
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    Low-cost CAD system for teaching digital testUbar, Raimund-Johannes; Raik, Jaan; Paomets, Priidu; Ivask, Eero; Jervan, Gert; Markus, AnttiMicroelectronics education : proceedings of the European Workshop, Grenoble, France, 5-6 Feb 19961996 / p. 185-188
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    Mixed-level deterministic-random test generation for digital systemsJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 5th International Conference on Mixed Design of Integrated Circuits and Systems, Lodz, Poland, June 18-20, 19981998 / p. 335-340
    artikkel kogumikus
  • artikkel ajakirjas
    Mixed-level test generator for digital systemsBrik, Marina; Jervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering1997 / 4, p. 271-282 : ill
    artikkel ajakirjas
  • artikkel kogumikus
    A set of tools for estimating quality of built-in self-test in digital circuitsJervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the International Symposium on Signals, Circuits and Systems, Iasi (Romania), October 2-3, 19971997 / p. 362-365
    artikkel kogumikus
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    Teaching test and design for testability with TURBO-TESTER softwareJervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 3rd Workshop on Mixed Design of Integrated Circuits and Systems, Lodz, May 19961996 / p. 589-594
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  • artikkel kogumikus
    Test set minimization using bipartite graphsMarkus, Antti; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 175-178: ill
    artikkel kogumikus
  • artikkel kogumikus
    Turbo tester : a CAD system for teaching digital testJervan, Gert; Markus, Antti; Paomets, Priidu; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics education : proceedings of the 2nd European Workshop held in Noordwijkerhout, The Netherlands, 14-15 May 19981998 / p. 287-290: ill
    artikkel kogumikus
  • artikkel kogumikus
    VHDL based test generation systemJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 19981998 / p. 145-148
    artikkel kogumikus
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