Numerical simulation of electrothermal effects in ESD protection devices
autor
vastutusandmed
Hellstrom, S., Freydin, B., Velmre, E., Udal, A.
allikas
ESREF’92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : 5-8 October 1992, Schwäbisch Gmünd, Germany : conference proceedings
ilmumiskoht
Berlin
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 77-80
konverentsi nimetus, aeg
ESREF’92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : 5-8 October 1992
konverentsi toimumispaik
Schwäbisch Gmünd, Germany
TTÜ struktuuriüksus
keel
inglise
Hellström, S., Freydin, B., Velmre, E., Udal, A. Numerical simulation of electrothermal effects in ESD protection devices // ESREF’92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : 5-8 October 1992, Schwäbisch Gmünd, Germany : conference proceedings. Berlin : VDE-Verlag, 1992. p. 77-80.