Numerical simulation of electrothermal effects in ESD protection devices
author
statement of authorship
Hellstrom, S., Freydin, B., Velmre, E., Udal, A.
source
ESREF’92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : 5-8 October 1992, Schwäbisch Gmünd, Germany : conference proceedings
location of publication
Berlin
publisher
year of publication
pages
p. 77-80
conference name, date
ESREF’92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : 5-8 October 1992
conference location
Schwäbisch Gmünd, Germany
TalTech department
language
inglise
Hellström, S., Freydin, B., Velmre, E., Udal, A. Numerical simulation of electrothermal effects in ESD protection devices // ESREF’92: 3rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : 5-8 October 1992, Schwäbisch Gmünd, Germany : conference proceedings. Berlin : VDE-Verlag, 1992. p. 77-80.