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artikkel kogumikus

Hierarchical analysis of short defects between metal lines in CMOS ICPleskacz, Witold A.; Jenihhin, Maksim; Raik, Jaan; Rakowski, Michal; Ubar, Raimund-Johannes; Kuzmicz, WieslawProceedings : 11th EUROMICRO Conference on Digital System Design : Architectures, Methods and Tools : (DSD 2008) : September 3-5, 2008, Parma, Italy2008 / p. 729-734 : ill https://ieeexplore.ieee.org/document/4669309

artikkel kogumikus

Layout to logic defect analysis for hierarchical test generationJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Rakowski, MichalProceedings of the 2007 IEEE Workshop on Design and Diagnostic Circuits and Systems : April 11-13, 2007, Krakow, Poland2007 / p. 35-40 : ill http://dx.doi.org/10.1109/DDECS.2007.4295251

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Rakowski, Michal (autor)

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