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51

artikkel kogumikus

Invited paper: System-Wide Fault Management based on IEEE P1687 IJTAGJutman, Artur; Devadze, Sergei; Aleksejev, Jevgeni6th International Workshop on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC) : 20-22 June 2011, Montpeillier, France2011 / [4] p.: ill https://ieeexplore.ieee.org/document/5981520

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IRSYD : an internal representation for heterogeneous embedded systemsEllervee, PeeterProceedings of NORCHIP'98 Conference, November 9-10, 1998, Lund, Sweden1998 / p. 214-221 : ill

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53

artikkel ajakirjas

Kõigile meeldivad targad tooted - tehkem siis rohkem koos- ja arendustööd!Sarv, Mari ÖöMente et Manu2018 / lk. 36-37 : fot https://www.ttu.ee/ttu-uudised/ajaleht-mente-et-manu/mente-et-manu/ http://www.ester.ee/record=b1242496*est https://artiklid.elnet.ee/record=b2836035*est

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54

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Lattice-based threshold signature implementation for constrained devicesDobias, Patrik; Ricci, Sara; Dzurenda, Petr; Malina, Lukas; Snetkov, NikitaProceedings of the 20th International Conference on Security and Cryptography (SECRYPT 2023). Vol. 12023 / p. 724-730 https://doi.org/10.5220/0012112700003555

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Learning situations and remote labs in embedded system educationSell, Raivo; Seiler, SvenProceedings of 14th International Workshop on Research and Education in Mechatronics2013 / p. 97-101 : ill https://www.researchgate.net/publication/256116848_Learning_Situations_and_Remote_Labs_in_Embedded_System_Education

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Mapping of VHDL structures for generic EDA database format IRSYDIvask, Eero; Ellervee, PeeterThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 317-320 : ill

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dissertatsioon

Microﬂuidic Droplet Detection, Classiﬁcation and Quality Assessment for Embedded Flow Cytometry Systems = Tilkade tuvastamine mikroﬂuidikas, nende klassiﬁtseerimine ja kvaliteedi hindamine sardsetes voolutsütomeetria süsteemidesAfrin, Fariha2025 https://www.ester.ee/record=b5758191*est https://digikogu.taltech.ee/et/Item/fa72df11-6487-4314-bd3d-5a7b1f5a263e https://doi.org/10.23658/taltech.57/2025

dissertatsioon

Seotud publikatsioonid 5

58

artikkel ajalehes

Missioonikriitiliste sardsüsteemide arendamise nimel : [Integreeritud Elektroonikasüsteemide ja Biomeditsiinitehnika Tippkeskusest : intervjuu Raimund Ubari ja Gert Jervaniga]Ubar, Raimund-Johannes; Jervan, Gert; Ummelas, MartMente et Manu2009 / 30. jaan., lk. 1, 3 : ill ; 16. veebr., lk. 5 : ill https://www.ester.ee/record=b1242496*est

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59

artikkel kogumikus

Modal embeddings and calling paradigmsSanto, José Espírito; Pinto, Luís; Uustalu, TarmoDays in Logic 2022 : Universidade do Algrave, June 30-July 2, 20222022 / 20 p https://drops.dagstuhl.de/opus/volltexte/2019/10525/pdf/LIPIcs-FSCD-2019-18.pdf https://daysinlogic2022.ualg.pt/wp-content/uploads/2022/06/BookletDiL2022.pdf

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Model driven development of networked embedded systemsKarpištšenko, AndreEleventh Estonian Winter School in Computer Science (EWSCS'06) : Park Hotel Palmse, Lahemaa, Estonia : March 5-10, 20062006 / [1] p

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Model transformations in the Gene-Auto Automatic Code GenerationToom, Andres; Näks, TõnuInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / p. 126-129 : ill

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Model-based synthesis of reactive planning on-line testers for non-deterministic embedded systemsKääramees, Marko; Vain, Jüri; Raiend, KulloBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 189-192 : ill

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Motivation-driven learning processes at the example of embedded systemsHollstein, Thomas; Reinsalu, Uljana; Leier, Mairo10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia2014 / p. 3-6 : ill

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artikkel kogumikus EST / artikkel kogumikus ENG

MPM4CPS : Multi-Paradigm Modelling for Cyber-Physical SystemsVangheluwe, Hans; Amaral, Vasco; Norta, AlexanderSTAF16-DS-PS 2016 : STAF 2016 Doctoral Symposium and Projects Showcase : joint proceedings of the Doctoral Symposium and Projects Showcase Held as Part of STAF 2016 co-located with Software Technologies : Applications and Foundations (STAF 2016) : Vienna, Austria, July 4-7, 20162016 / p. 40-47 http://ceur-ws.org/Vol-1675/ Conference Proceedings at Scopus Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG

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Multi-level binarized LSTM in EEG classification for wearable devicesNazari, N.; Mirsalari, Seyed Ahmad; Sinaei, S.; Salehi, M.E.; Daneshtalab, Masoud2020 28th Euromicro International Conference on Parallel, Distributed and Network-Based Processing : PDP 2020, Västerås, Sweden, 11-13 March 20202020 / p. 175-181 https://doi.org/10.1109/PDP50117.2020.00033

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Märkmikmälu sardsüsteemisToomsalu, ArvoA & A2011 / 1, lk. 9-18 : ill https://artiklid.elnet.ee/record=b2401506*est

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67

artikkel kogumikus

New categories of Safe Faults in a processor-based Embedded SystemGürsoy, Cemil Cem; Jenihhin, Maksim; Oyeniran, Adeboye Stephen; Piumatti, Davide; Raik, Jaan; Sonza Reorda, Matteo; Ubar, Raimund-Johannes2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 4 p. : ill https://doi.org/10.1109/DDECS.2019.8724642

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NN-SANARX model based control of a water tank system using embedded microcontroller ArduinoŠkiparev, Vjatšeslav; Belikov, Juri; Petlenkov, EduardProceedings of the 2019 10th IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications : IDAACS'2019, 18-21 Sept. 20192019 / p. 372-377 : ill https://doi.org/10.1109/IDAACS47747.2019

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dissertatsioon

Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemidesKruus, Helena2011

dissertatsioon

70

artikkel kogumikus

Optimization of memory-constrained hybrid BIST for testing core-based systemsJervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund-JohannesProceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 20072007 / p. 71-77 https://ieeexplore.ieee.org/document/4297319

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Practicing start-up culture in teaching embedded systemsReinsalu, Uljana; Azad, Siavoosh Payandeh; Leier, Mairo; Tammemäe, Kalle; Hollstein, ThomasEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496463

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PrefaceUbar, Raimund-Johannes; Raik, Jaan; Vierhaus, Heinrich TheodorDesign and test technology for dependable systems-on-chip2011 / p. xxii-xxviii

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Profiling in deeply embedded systemsMoorits, Erkki; Jervan, GertBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 127-230

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Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 385-392 : ill https://doi.org/10.1109/AUTEST.2016.7589627

artikkel kogumikus

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artikkel ajakirjas

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE instrumentation & measurement magazine2017 / p. 23-30 : ill https://doi.org/10.1109/MIM.2017.8006390

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