Otsing - TalTech teadusportaal

kuva

reasta

12876

artikkel ajakirjas

[Deeringi reaskülvimasin]Uus Talu1927 / lk. 259 : fot

artikkel ajakirjas

12877

artikkel ajakirjas

"Deeringi" uus niidumasinPõllumees1932 / lk. 291-292 : joon

artikkel ajakirjas

12878

artikkel ajakirjas

"Deering-Mc Cormik" niidumasina 100 a. juubel 1831-1931Tehnika Põllumajanduses1931 / lk. 45-48 : fot

artikkel ajakirjas

12879

artikkel kogumikus

Defect analysis of renovated facade walls with etics solutions in cold climate conditionsLiisma, Eneli; Sepri, Raili; Raado, Lembi-Merike; Lill, Irene; Witt, Emlyn David Qivitoq; Sulakatko, Virgo; Põldaru, MattiasCESB 16 - Central Europe Towards Sustainable Building 2016 : Innovations for Sustainable Future : [book of abstracts]2016 / p. 65-66

artikkel kogumikus

12880

artikkel kogumikus

Defect analysis of renovated facade walls with etics solutions in cold climate conditions [Online resource]Liisma, Eneli; Sepri, Raili; Raado, Lembi-Merike; Lill, Irene; Witt, Emlyn David Qivitoq; Sulakatko, Virgo; Põldaru, MattiasCESB 16 - Central Europe Towards Sustainable Building 2016 : Innovations for Sustainable Future : [electronic proceedings]2016 / p. 174-181 : ill

artikkel kogumikus

12881

artikkel kogumikus

Defect oriented fault coverage of 100stuck-at fault test setsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 20002000 / p. 511-516 : ill https://repo.pw.edu.pl/info.seam?ps=20&id=WUT7e20f35d67ae45d3b2d1264d7a4ba722&lang=en&pn=1&cid=156607

artikkel kogumikus

12882

artikkel ajakirjas

Defect structure of Cl and Cu doped CdS heat treated in Cd and S2 vapourKukk, Peeter-Enn; Altosaar, MareJournal of solid state chemistry1983 / p. 1-11

artikkel ajakirjas

12883

artikkel ajakirjas

Defect structure of Cu‐doped cadmium selenideÖpik, Andres; Varvas, JüriPhysica status solidi (a) : applications and materials science1982 / p. 467-473 : ill https://doi.org/10.1002/pssa.2210740212 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas

12884

artikkel ajakirjas

Defect structure of silver-doped cadmium tellurideNirk, TiitTallinna Tehnikaülikooli Toimetised1994 / lk. 3-12: ill

artikkel ajakirjas

12885

artikkel ajakirjas EST / artikkel ajakirjas ENG

Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopyKask, Erkki; Grossberg, Maarja; Josepson, Raavo; Salu, Pille; Timmo, Kristi; Krustok, JüriMaterials science in semiconductor processing2013 / p. 992-996 : ill https://doi.org/10.1016/j.mssp.2013.02.009 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

12886

artikkel kogumikus

Defect-oriented BIST quality analysisKruus, Helena; Ubar, Raimund-Johannes; Raik, JaanBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 153-156 : ill

artikkel kogumikus

12887

artikkel kogumikus

Defect-oriented fault simulation and test generation in digital circuitsKuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California2001 / p. 365-371 https://ieeexplore.ieee.org/document/915257

artikkel kogumikus

12888

artikkel kogumikus

Defect-oriented library builder and hierarchical test generationCibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 163-168 : ill

artikkel kogumikus

12889

artikkel ajakirjas

Defect-oriented mixed-level fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaFacta Universitatis [Niš]. Series electronics and energetics2002 / 1, April, p. 123-136 : ill

artikkel ajakirjas

12890

artikkel kogumikus

Defect-oriented modul-level fault diagnosis in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 81-86

artikkel kogumikus

12891

artikkel kogumikus

Defect-oriented test- and layout-generation for standard-cell ASIC designsSudbrock, Joachim; Raik, Jaan; Ubar, Raimund-Johannes; Kuzmicz, Wieslaw; Pleskacz, Witold A.Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 79-82 : ill https://ieeexplore.ieee.org/document/1559781

artikkel kogumikus

12892

artikkel kogumikus

Defect-oriented test generation and fault simulation in the environment of MOSCITOSchneider, Andre; Diener, Karl-Heinz; Gramatova, Elena; Fisherova, Maria; Ivask, Eero; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Kuzmicz, W.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 303-306 : ill

artikkel kogumikus

12893

artikkel kogumikus

Defect-oriented test generation using probabilistic estimationCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 20002001 / p. 131-136 : ill

artikkel kogumikus

12894

artikkel kogumikus

Defects and their formation processes in non-stoichiometric II-VI compoundesErm, Ants; Krustok, Jüri; Kukk, Peeter-Enn32nd IUPAC Congress, Stockholm, 2-7 August 1989 : book of abstracts1989 / p. 94 https://www.ester.ee/record=b4149424*est

artikkel kogumikus

12895

artikkel kogumikus

Defects in CdTe-based photodetectorsValdna, VelloMaterials Research Society Symposia proceedings series2000 / p. 241-246 : ill

artikkel kogumikus

12896

artikkel kogumikus

Defects in chlorine doped CdTe thin filmsValdna, Vello; Hiie, Jaan; Gavrilov, AlekseiAbstracts POLYSE2000 / p. 36

artikkel kogumikus

12897

artikkel ajakirjas

Defects in chlorine-doped CdTe thin filmsValdna, Vello; Hiie, Jaan; Gavrilov, AlekseiSolid state phenomena2001 / p. 155-160 : ill

artikkel ajakirjas

12898

artikkel kogumikus

Defects in Cl and Na doped CdTe monograin powdersAltosaar, Mare; Kukk, Peeter-Enn; Raudoja, Jaan; Mellikov, EnnE-MRS Spring Meeting : Strasbourg, 1999 : abstracts1999 / p. O-32 https://www.sciencedirect.com/science/article/abs/pii/S0040609099008135

artikkel kogumikus

12899

artikkel kogumikus

Defects, faults and fault modelsGramatova, Elena; Fisherova, Maria; Ubar, Raimund-Johannes; Pleskacz, Witold A.Handbook of testing electronic systems2005 / p. 26-96 : ill

artikkel kogumikus

12900

raamat

Defektide ja rikete seoste analüüs : lepingu Lep16039 aruanne [Võrguväljaanne]Palu, Ivo; Keel, Matti; Tammoja, Heiki2016 https://www.elektrilevi.ee/-/doc/6305157/ettevottest/defektide_rikete_aruanne.pdf

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