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126

artikkel kogumikus

Simulation-based equivalence checking between IEEE 1687 ICL and RTLDamljanovic, Aleksa; Jutman, Artur; Portolan, Michele; Tšertov, Anton2019 IEEE International Test Conference (ITC)2019 / paper. 7.3, 8 p. : ill https://doi.org/10.1109/ITC44170.2019.9000181

artikkel kogumikus

127

artikkel kogumikus

SoC and board modeling for processor-centric board testingTšertov, Anton; Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei14th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : DSD 2011 : 31 August - 2 September 2011, Oulu, Finland : proceedings2011 / p. 575-582 : ill https://ieeexplore.ieee.org/document/6037463

artikkel kogumikus

128

artikkel kogumikus

SSBDD model : advantageous properties and efficient simulation algorithmsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest2002 / p. 345-346 : ill

artikkel kogumikus

129

artikkel kogumikus

SSBDDs : advantageous model and efficient algorithms for digital circuit modeling, simulation & testJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes5th International Workshop on Boolean Problems : September 19-20, 2002, Freiberg (Sachsen) : proceedings2002 / p. 157-166 : ill

artikkel kogumikus

130

artikkel kogumikus

Structural fault collapsing by superposition of BDDs for test generation in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA2010 / p. 250-257 : ill https://ieeexplore.ieee.org/document/5450451

artikkel kogumikus

131

artikkel kogumikus

Structurally synthesized binary decision diagramsJutman, Artur; Peder, Ahti; Raik, Jaan; Tombak, Mati; Ubar, Raimund-JohannesBoolean Problems : 6th International Workshop : September 23-24, 2004, Freiberg2004 / p. 271-278 : ill

artikkel kogumikus

132

artikkel kogumikus

Structurally synthesized multiple input BDDs for simulation of digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, Artur16th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2009 : Yasmine Hammamet, Tunesia, 13-19 December, 20092009 / p. 451-454 : ill http://dx.doi.org/10.1109/ICECS.2009.5410895

artikkel kogumikus

133

artikkel kogumikus

Structurally synthesized multiple input BDDs for speeding up logic-level simulation of digital circuitsMironov, Dmitri; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, Artur13th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : DSD 2010 : Lille, France, 1-3 September 2010 : proceedings2010 / p. 658-663 : ill

artikkel kogumikus

134

artikkel kogumikus

A suite of IEEE 1687 benchmark networksTšertov, Anton; Jutman, Artur; Devadze, Sergei2016 IEEE International Test Conference (ITC) : proceedings2016 / art. 6.1, p. 1-10 : ill https://doi.org/10.1109/TEST.2016.7805840

artikkel kogumikus

135

artikkel kogumikus

Synchronization, calibration and triggering of IEEE 1687 embedded instrumentsJutman, Artur; Devadze, Sergei; Shibin, KonstantinThe Seventeenth Workshop on RTL and High Level Testing (WRTLT'16) : November 24-25, 2016, Aki Grand Hotel, Hiroshima, Japan2016 / [6] p

artikkel kogumikus

136

dissertatsioon

System modeling for processor-centric test automation = Süsteemide modelleerimine protsessorikesksete testprogrammide sünteesi automatiseerimiseksTšertov, Anton2012 https://www.ester.ee/record=b2751131*est

dissertatsioon

137

artikkel kogumikus

System-wide fault management based on IEEE P1687 IJTAGShibin, Konstantin; Jutman, Artur; Devadze, SergeiInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa2012 / p. 81-84 : ill

artikkel kogumikus

138

artikkel kogumikus

Teaching digital RT-level self-test using a Java appletDevadze, Sergei; Jutman, Artur; Sudnitsõn, Aleksander; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich20th IEEE NORCHIP Conference : Copenhagen, Denmark, November 11-12, 20022002 / p. 322-328 : ill

artikkel kogumikus

139

artikkel kogumikus

Teaching digital test with BIST analyzerJutman, Artur; Tšertov, Anton; Tšepurov, Anton; Aleksejev, Igor; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 123-128 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610171

artikkel kogumikus

140

artikkel ajakirjas

Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocolsBengtsson, Tomas; Kumar, Shashi; Ubar, Raimund-Johannes; Jutman, Artur; Peng, ZeboIET computers and digital techniques2008 / 6, p. 445-460

artikkel ajakirjas

141

artikkel kogumikus

Testing beyond the SoCs in a lego styleTšertov, Anton; Jutman, Artur; Devadze, SergeiProceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 20102010 / p. 334-338 : ill https://ieeexplore.ieee.org/document/5742052

artikkel kogumikus

142

artikkel kogumikus

Testing toolsJutman, ArturHandbook of testing electronic systems2005 / p. 361-365 : ill

artikkel kogumikus

143

artikkel kogumikus

Testing tools for training and educationBalaž, M.; Jutman, Artur; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 12th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2005 : Krakow, Poland, 22-25 June, 2005. Vol. 1 of 22005 / p. 671-676 : ill

artikkel kogumikus

144

artikkel kogumikus

The synthesis level in Bloom's taxonomy - a nightmare for an LMSWuttke, Heinz-Dietrich; Ubar, Raimund-Johannes; Henke, Karsten; Jutman, Artur19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 199-204 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610186

artikkel kogumikus

145

artikkel kogumikus

Timing simulation of digital circuits with binary decision diagramsUbar, Raimund-Johannes; Jutman, Artur; Peng, Z.Design, Automation and Test in Europe : Conference and Exhibition 2001 : Munich, Germany, March 13-16, 2001 : proceedings2001 / p. 460-466 : ill https://ieeexplore.ieee.org/document/915063

artikkel kogumikus

146

artikkel kogumikus

Towards artificial intelligence based automatic adaptive response analyzer for high frequency analog BISTPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesCIMSA 2008 : IEEE International Conference on Computational Intelligence for Measurement Systems and Applications : Istanbul, Turky, July 14-16, 20082008 / p. 99-104 : ill https://ieeexplore.ieee.org/document/4595841

artikkel kogumikus

147

artikkel kogumikus

Trainer 1149 : a boundary scan simulation bundle with hardware support for labsShibin, Konstantin; Jutman, ArturInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 135-138 : ill

artikkel kogumikus

148

artikkel kogumikus

Trainer 1149: a boundary scan simulation bundle for labsJutman, Artur; Ubar, Raimund-Johannes; Devadze, Sergei; Shibin, Konstantin; Rosin, VjatšeslavMIXDES 2011 : 18th International Conference "Mixed Design of Integrated Circuits and Systems" : June 16-18, 2011, Gliwice, Poland2011 / p. 520-525

artikkel kogumikus

149

artikkel ajakirjas

Turbo tester - diagnostic package for research and trainingAarna, Margit; Ivask, Eero; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Ubar, Raimund-Johannes; Vislogubov, Vladislav; Wuttke, Heinz-DietrichRadioelectronics and informatics2003 / p. 69-73 : ill

artikkel ajakirjas

150

artikkel kogumikus

Turning JTAG inside out for fast extended test accessDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-Johannes10th IEEE Latin American Test Workshop : 2-5 March 2009, Brazil2009 / [6] p. : ill https://ieeexplore.ieee.org/document/4813799

artikkel kogumikus

Jutman, Artur (autor)

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