Otsing - TalTech teadusportaal

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artikkel kogumikus

Design error diagnosis using backtrace algorithm on decision diagramsRepinski, Urmas; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, Maksim; Tšepurov, AntonInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / p. 93-96

artikkel kogumikus

27

artikkel kogumikus

Diagnostic modeling of digital systems with low- and high-level decision diagramsUbar, Raimund-JohannesLATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]2013 / [1] p

artikkel kogumikus

28

artikkel kogumikus

Diagnostic modeling of digital systems with multi-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, MaksimDesign and test technology for dependable systems-on-chip2011 / p. 92-118 : ill https://www.researchgate.net/publication/344994231_Diagnostic_Modeling_of_Digital_Systems_with_Multi-Level_Decision_Diagrams

artikkel kogumikus

29

artikkel kogumikus

Diagnostic modeling of microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, Maksim; Brik, Marina; Istenberg, Martin; Wuttke, Heinz-DietrichBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 147-150 : ill

artikkel kogumikus

30

artikkel kogumikus

Diagnostic modelling of digital systems with binary and high-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Kruus, Helena; Lensen, Harri; Evartson, TeetProgress in industrial mathematics at ECMI 20062008 / p. 902-907 : ill https://link.springer.com/chapter/10.1007/978-3-540-71992-2_158

artikkel kogumikus

31

artikkel ajakirjas

Diagnostic modelling of digital systems with decision diagramsUbar, Raimund-JohannesВестник Томского государственного университета : приложение2004 / август, материалы международных, всесоюзных и региональных научных конференций, симпозиумов, школ, проводимых в ТГУ, с. 174-179 : ил

artikkel ajakirjas

32

artikkel kogumikus

Diagnostic modelling of digital systems with multi-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Evartson, Teet; Kruus, Margus; Lensen, HarriProceedings of the 17th IASTED International Conference on Modelling and Simulation : May 24-26, 2006, Montreal, Quebec, Canada2006 / p. 207-212 : ill

artikkel kogumikus

33

artikkel kogumikus

Digitaalsüsteemide diagnostika Tallinna TehnikaülikoolisUbar, Raimund-JohannesTeadusmõte Eestis : tehnikateadused2002 / lk. 107-113 : ill

artikkel kogumikus

34

artikkel kogumikus

Dynamic analysis of digital circuits with 5-valued simulationUbar, Raimund-JohannesMixed design of integrated circuits and systems1998 / p. 187-192: ill https://link.springer.com/chapter/10.1007/978-1-4615-5651-0_29

artikkel kogumikus

35

artikkel kogumikus

Equivalent transformations of structurally synthesized BDDs and applicationsJürimägi, Lembit; Ubar, Raimund-Johannes; Viies, Vladimir2019 8th Mediterranean Conference on Embedded Computing (MECO)2019 / 6 p. : ill https://doi.org/10.1109/MECO.2019.8760283

artikkel kogumikus

36

artikkel kogumikus

Fast RTL fault simulation using decision diagrams and bitwise set operationsReinsalu, Uljana; Raik, Jaan; Ubar, Raimund-Johannes; Ellervee, Peeter2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada2011 / p. 164-170 https://ieeexplore.ieee.org/document/6104440

artikkel kogumikus

37

artikkel ajakirjas

Fault effect reasoning in digital systems by topological view on low- and high-level decision diagramsUbar, Raimund-JohannesВестник Томского государственного университета. Управление, вычислительная техника и информатика2014 / p. 99-113 : ill http://journals.tsu.ru/informatics/&journal_page=archive&id=923&article_id=12107

artikkel ajakirjas

38

artikkel kogumikus

Fault modeling and test generation with low- and high-level decision diagramsUbar, Raimund-Johannes24. GI/GMM/ITG-Workshop : Testmethoden und Zuverlässigkeit von Schaltungen und Systemen2012 / p. 1-12

artikkel kogumikus

39

dissertatsioon

Fault simulation and code coverage analysis of RTL designs using high-level decision diagrams = Rikete simuleerimine ja koodikatte analüüs register-siirde tasemel kasutades kõrgtaseme otsustusdiagrammeReinsalu, Uljana2013 https://www.ester.ee/record=b2963595*est

dissertatsioon

40

artikkel kogumikus

Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDsDevadze, Sergei; Raik, Jaan; Jutman, Artur; Ubar, Raimund-Johannes7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings2006 / p. 97-102 : ill

artikkel kogumikus

41

dissertatsioon

Formal verification and error correction on high-level decision diagrams = Formaalne verifitseerimine ja vigade parandamine kõrgtasemelistel otsustusdiagrammidelKarputkin, Anton2012

dissertatsioon

42

artikkel kogumikus

FPGA design flow with automated test generationElst, G.; Diener, Karl-Heinz; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesProc. of German 11th Workshop on Test Technology and Reliability of Circuits and Systems : Potsdam, 19991999 / p. 120-123 https://masters.donntu.ru/2010/fknt/masyakin/library/article7.pdf

artikkel kogumikus

43

artikkel kogumikus

Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault modelUbar, Raimund-Johannes; Borrione, DominiqueXI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings1998 / p. 51-54 https://ieeexplore.ieee.org/document/715409

artikkel kogumikus

44

artikkel kogumikus

Hierarchical calculation of malicious faults for evaluating the fault-toleranceUbar, Raimund-Johannes; Devadze, Sergei; Jenihhin, Maksim; Raik, Jaan; Jervan, Gert; Ellervee, PeeterProceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China2008 / p. 222-227 : ill https://ieeexplore.ieee.org/document/4459544

artikkel kogumikus

45

artikkel kogumikus

Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Evartson, Teet; Lensen, Harri; Aarna, Margit5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada2007 / [6] p. [CD-ROM]

artikkel kogumikus

46

artikkel kogumikus

Hierarchical test generation with multi-level decision diagram modelsJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 19981998 / p. 26-33 https://www.academia.edu/67811738/Hierarchical_Test_Generation_with_Multi_Level_Decision_Diagram_Models?hb-g-sw=7883185

artikkel kogumikus

47

artikkel kogumikus

High level decision diagrams and characteristic polynomialsKarputkin, AntonInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 143-146 : ill

artikkel kogumikus

48

artikkel kogumikus

High-level decision diagram based fault models for targeting FSMsRaik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 353-358 : ill http://dx.doi.org/10.1109/DSD.2006.60

artikkel kogumikus

49

artikkel kogumikus

High-Level Decision Diagram manipulations for code coverage analysisMinakova, Karina; Reinsalu, Uljana; Tšepurov, Anton; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 207-210 : ill

artikkel kogumikus

50

artikkel kogumikus

High-level decision diagram simulation for diagnosis and soft-error analysisRaik, Jaan; Repinski, Urmas; Jenihhin, Maksim; Chepurov, AntonDesign and test technology for dependable systems-on-chip2011 / p. 294-309 : ill https://www.igi-global.com/chapter/high-level-decision-diagram-simulation/51406

artikkel kogumikus

otsustusdiagrammid (märksõna)

teaviku laadid

märksõna 1