Otsing - TalTech teadusportaal

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artikkel kogumikus

A benchmark suite for evaluating the efficiency of test toolsKruus, Helena; Ubar, Raimund-Johannes; Ellervee, Peeter; Gorev, Maksim; Pesonen, Vadim; Devadze, Sergei; Orasson, Elmet; Brik, Marina; Min, Mart; Annus, Paul; Kruus, Margus; Meigas, KaljuBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 85-88 : ill

artikkel kogumikus

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artikkel kogumikus

Complementing ICT studies with learning objects on domain ontologiesRobal, Tarmo; Kruus, Helena; Kalja, AhtoProceedings of the 24th International Conference on European Association for Education in Electrical and Information Engineering : 30-31 May 2013, Chania, Greece2013 / p. 92-96 : ill

artikkel kogumikus

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artikkel kogumikus

Defect-oriented BIST quality analysisKruus, Helena; Ubar, Raimund-Johannes; Raik, JaanBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 153-156 : ill

artikkel kogumikus

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artikkel kogumikus

Diagnostic modelling of digital systems with binary and high-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Kruus, Helena; Lensen, Harri; Evartson, TeetProgress in industrial mathematics at ECMI 20062008 / p. 902-907 : ill https://link.springer.com/chapter/10.1007/978-3-540-71992-2_158

artikkel kogumikus

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artikkel kogumikus

Diagnostic software with WEB interface for teaching purposesVislogubov, Vladislav; Jutman, Artur; Kruus, Helena; Orasson, Elmet; Raik, Jaan; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 255-258 : ill

artikkel kogumikus

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artikkel kogumikus

e-Bibliothecula - a virtual library serviceRobal, Tarmo; Kruus, HelenaProceedings of the Thirteenth International Conference on Information Systems Development : Advances in Theory, Practice and Education : Vilnius, Lithuania2004 / p. 139-148

artikkel kogumikus

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artikkel ajakirjas

Environment for the analysis of functional self-test quality in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Kruus, Helena; Aarna, Margit; Devadze, SergeiProceedings of the Estonian Academy of Sciences2014 / p. 151-162 : ill https://artiklid.elnet.ee/record=b2673964*est

artikkel ajakirjas

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artikkel kogumikus

Evaluation of SysML software for teaching systems engineering basicsKruus, Helena; Jervan, GertProceedings of the 25th International Conference on European Association for Education in Electrical and Information Engineering : 30 May-June 2014, Cesme, Türkiye2014 / p. 29-32 : ill

artikkel kogumikus

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artikkel kogumikus

Hardware close programming for freshmenKruus, Helena; Brik, Marina; Kruus, Margus; Ruberg, Priit; Viies, Vladimir; Ellervee, Peeter10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia2014 / p. 93-96 : ill

artikkel kogumikus

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artikkel ajakirjas

High quality test generation for digital systemsUbar, Raimund-Johannes; Aarna, Margit; Kruus, Helena; Raik, JaanRomanian journal of information science and technology2005 / 1, p. 73-84 : ill

artikkel ajakirjas

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artikkel kogumikus

How to generate high quality tests for digital systemsUbar, Raimund-Johannes; Aarna, Margit; Kruus, Helena; Raik, Jaan2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 22004 / p. 459-462 : ill http://dx.doi.org/10.1109/SMICND.2004.1403048

artikkel kogumikus

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artikkel kogumikus

A hybrid BIST architecture and its optimization for SoC testingJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Kruus, HelenaProceedings of the 3rd International Symposium on Quality Electronic Design : ISQED 2002, March 18-21, 2002, San Jose, California2002 / p. 273-279 : ill https://ieeexplore.ieee.org/document/996750

artikkel kogumikus

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artikkel kogumikus

Hybrid BIST optimization using reseeding and test set compactionJervan, Gert; Orasson, Elmet; Kruus, Helena; Ubar, Raimund-Johannes10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 596-603 : ill http://dx.doi.org/10.1109/DSD.2007.4341529

artikkel kogumikus

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artikkel ajakirjas

Hybrid BIST optimization using reseeding and test set compactionJervan, Gert; Orasson, Elmet; Kruus, Helena; Ubar, Raimund-JohannesMicroprocessors and microsystems2008 / 5/6, p. 254-262 : ill https://www.sciencedirect.com/science/article/abs/pii/S0141933108000288

artikkel ajakirjas

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artikkel ajakirjas

Infotehnoloogia rebane - milline ta on? : [esmakursuslaste arvutiteadmistest]Kruus, HelenaArvutikasutaja2003 / 1, lk. 6

artikkel ajakirjas

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artikkel kogumikus

Investigating defects in digital circuits by Boolean differential equationsKruus, Helena; Orasson, Elmet; Robal, Tarmo; Ubar, Raimund-JohannesThe 4th International Conference "Distance Learning - Educational Sphere of XXI Century" (DLESC'04)2004 / p. 432-435

artikkel kogumikus

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artikkel kogumikus

Involving students in teaching process — encouraging student-generated content in ICT studiesKruus, Helena; Ellervee, Peeter; Robal, Tarmo; Ruberg, Priit; Kruus, MargusProceedings of the 24th International Conference on European Association for Education in Electrical and Information Engineering : 30-31 May 2013, Chania, Greece2013 / p. 76-81 : ill

artikkel kogumikus

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artikkel kogumikus

Laboratory framework TEAM for investigating the dependability issues of microprocessor systemsJasnetski, Artjom; Tšertov, Anton; Ubar, Raimund-Johannes; Kruus, Helena10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia2014 / p. 80-83 : ill

artikkel kogumikus

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dissertatsioon

Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemidesKruus, Helena2011

dissertatsioon

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artikkel kogumikus

Optimization of memory-constrained hybrid BIST for testing core-based systemsJervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund-JohannesInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 133-136 : ill

artikkel kogumikus

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artikkel kogumikus

Optimization of memory-constrained hybrid BIST for testing core-based systemsJervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund-JohannesProceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 20072007 / p. 71-77 https://ieeexplore.ieee.org/document/4297319

artikkel kogumikus

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artikkel kogumikus

Optimization of the store-and-generate based built-in self-testUbar, Raimund-Johannes; Jervan, Gert; Kruus, Helena; Orasson, Elmet; Aleksejev, IgorBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 199-202 : ill

artikkel kogumikus

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artikkel ajakirjas

Sisseehitatud isetestimine digitaalsüsteemidesKruus, HelenaA & A2011 / lk. 32-37 : ill https://artiklid.elnet.ee/record=b2472216*est

artikkel ajakirjas

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artikkel kogumikus

SysML in systems engineering courseKruus, Helena; Robal, Tarmo; Jervan, Gert10th European Workshop on Microelectronics Education : EWME 2014 : May 14-16, 2014, Tallinn, Estonia2014 / p. 177-181 : ill

artikkel kogumikus

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artikkel kogumikus

Teaching modeling in SysML/UML and problems encounteredKruus, Helena; Robal, Tarmo; Jervan, GertProceedings of the 25th International Conference on European Association for Education in Electrical and Information Engineering : 30 May-June 2014, Cesme, Türkiye2014 / p. 33-36 : ill

artikkel kogumikus

Kruus, Helena (TTÜ autor)

teaviku laadid

autor 57

CV 13

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