Otsing - TalTech teadusportaal

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101

dissertatsioon

DfT-based external test and diagnosis of mesh-like networks on chips = Testitavusel põhinev välise testi ja diagnoosi meetod kahemõõtmelistele kiipvõrkudeleGovind, Vineeth2009 https://digi.lib.ttu.ee/i/?454 https://www.ester.ee/record=b2539211*est

dissertatsioon

102

artikkel kogumikus

Diagnostic modeling of digital systems with low- and high-level decision diagramsUbar, Raimund-JohannesLATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]2013 / [1] p

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103

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Diagnostic modeling of digital systems with multi-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, MaksimDesign and test technology for dependable systems-on-chip2011 / p. 92-118 : ill https://www.researchgate.net/publication/344994231_Diagnostic_Modeling_of_Digital_Systems_with_Multi-Level_Decision_Diagrams

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104

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Diagnostic softwareUbar, Raimund-JohannesConcise encyclopedia of software engineering1993 / p. 101-105

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105

artikkel kogumikus

Diagnostics of induction motor rotor faults using analysis of stator currentVaimann, Toomas6th International Symposium "Topical Problems in the Field of Electrical and Power Engineering" : Doctoral School of Energy and Geotechnology : [Kuressaare, January 12-17, 2009]2009 / p. 13-17 : ill

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106

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DIAGNOZER : a laboratory tool for teaching research in diagnosis of electronic systems [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Jutman, Artur; Raik, Jaan; Wuttke, Heinz-Dietrich2009 IEEE International Conference on Microelectronic Systems Education MSE '09 : 25-27 July 2009, San Francisco, California : [proceedings]2009 / p. 12-15 : ill. [CD-ROM] http://dx.doi.org/10.1109/MSE.2009.5270842

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107

artikkel kogumikus

Digital logic simulation with compressed BDDsUbar, Raimund-Johannes; Mironov, Dmitri; Devadze, Sergei; Raik, JaanProceedings : 2011 IEEE International Conference on Computer Science and Automation Engineering : June 10-12, 2011, Shanghai, China2011 / p. 105-109 : ill https://ieeexplore.ieee.org/document/5952643

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108

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Digital twin service unit development for an EV induction motor fault detectionRjabtšikov, Viktor; Mohamed, Mahmoud Ibrahim Hassanin; Asad, Bilal; Rassõlkin, Anton; Vaimann, Toomas; Kallaste, Ants; Kuts, Vladimir; Stepien, Mariusz; Krawczyk, Mateusz2023 IEEE International Conference on Electric Machines and Drives (IEMDC)2023 / 5 p https://doi.org/10.1109/IEMDC55163.2023.10239085

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Seotud publikatsioonid 1

Development methodology for creating the digital twin for propulsion drive of an electric vehicle = Elektrisõiduki veoajami digitaalse kaksiku arendusmetoodika

109

artikkel kogumikus

Digital Twin service unit for AC motor stator inter-turn short circuit fault detectionRjabtšikov, Viktor; Rassõlkin, Anton; Asad, Bilal; Vaimann, Toomas; Kallaste, Ants; Kuts, Vladimir; Jegorov, Sergei; Stępien, Mariusz; Krawczyk, Mateusz2021 28th International Workshop on Electric Drives : Improving Reliability of Electric Drives (IWED)2021 https://doi.org/10.1109/IWED52055.2021.9376328

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110

artikkel ajakirjas

Directional calibration of rogowski coil for localization of partial discharges in smart distribution networksShafiq, Muhammad; Kütt, Lauri; Isa, M.; Hashmi, M.; Lehtonen, MattiInternational review of electrical engineering2012 / p. 5881-5890 https://www.researchgate.net/publication/262703688_Directional_Calibration_of_Rogowski_Coil_for_Localization_of_Partial_Discharges_in_Smart_Distribution_Networks

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111

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Distance encoding waves for identification of lighting failuresGalkin, Ilja; Suzdalenko, Alexander; Armas, JelenaBEC 2012 : 2012 13th Biennial Baltic Electronics Conference : proceedings of the 13th Biennial Baltic Electronics Conference : October 3-5, 2012, Tallinn, Estonia2012 / p. 227-230 : ill

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112

artikkel kogumikus

Distributed approach for parallel exact critical path tracing fault simulationIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesMIXDES 2010 : 17th International Conference "Mixed Design of Integrated Circuits and Systems" : June 24-26, 2010, Wroclaw, Poland2010 / p. 471-476 : ill

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113

artikkel ajakirjas

Distributed approach for parallel exact critical path tracing fault simulationIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesInternational journal of microelectronics and computer science2010 / p. 165-174 : ill

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114

artikkel ajakirjas

Distributed fault simulation with collaborative load balancing for VLSI circuitsIvask, Eero; Devadze, Sergei; Ubar, Raimund-JohannesScalable computing : practice and experience2011 / p. 153-163 : ill

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115

artikkel kogumikus

Double phase fault collapsing with linear complexity in digital circuitsUbar, Raimund-Johannes; Jürimägi, Lembit; Orasson, Elmet; Josifovska, Galina; Oyeniran, Adeboye StephenDSD 2015 : 18th Euromicro Conference on Digital Systems Design : 26-28 August 2015, Funchal, Madeira, Portugal2015 / p. 700-705 : ill

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116

artikkel kogumikus

Dynamic analysis of digital circuits with 5-valued simulationUbar, Raimund-JohannesMixed design of integrated circuits and systems1998 / p. 187-192: ill https://link.springer.com/chapter/10.1007/978-1-4615-5651-0_29

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117

artikkel kogumikus

Eesti soosetete leviku seosed tektooniliste riketegaŠtokalenko, Mihkel; Orru, MallXIX aprillikonverentsi "Eesti mere- ja maapõue uuringutest ning arukast kasutamisest" teesid2011 / lk. 25-27 : kaart

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118

artikkel kogumikus

Effect of electrode shape on medium voltage covered conductor insulation durability under electric stressKiitam, Ivar; Taklaja, Paul; Tuttelberg, Kaur59th Annual International Scientific Conference on Power and Electrical Engineering : November 12, 13, 2018, Riga Technical University (RTUCON) : conference proceedings2018 / 6 p. : ill https://doi.org/10.1109/RTUCON.2018.8659862

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119

artikkel kogumikus

Effect of PM parameters variability on the operation quantities of a wind generatorKallaste, Ants; Belahcen, Anouar; Vaimann, Toomas2015 IEEE Workshop on Electrical Machines Design, Control and Diagnosis (WEMDCD) : proceedings : Castello del Valentino, Torino, Italy, 26-27 March, 20152015 / p. 242-247 : ill http://dx.doi.org/10.1109/WEMDCD.2015.7194536

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120

artikkel ajakirjas EST / artikkel ajakirjas ENG

Effective scalable IEEE 1687 instrumentation network for fault managementJutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE design & test2013 / p. 26-35 : ill https://doi.org/10.1109/MDAT.2013.2278535 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

121

artikkel kogumikus

Efficient fault injection based on dynamic HDL slicing techniqueBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 52-53 : ill https://doi.org/10.1109/IOLTS.2019.8854419

artikkel kogumikus

Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

122

artikkel kogumikus

Efficient methodology for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Rhodes, Greece2019 / p. 255-256 https://doi.org/10.1109/IOLTS.2019.8854449

artikkel kogumikus

Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

123

artikkel kogumikus

Efficient single-pattern fault simulation on structurally synthesized BDDsRaik, Jaan; Ubar, Raimund-Johannes; Devadze, Sergei; Jutman, ArturDependable Computing - EDCC-5 : 5th European Dependable Computing Conference : Budapest, Hungary, April 20-22, 2005 : proceedings2005 / p. 332-344 : ill

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124

artikkel ajakirjas EST / artikkel ajakirjas ENG

EFIC-ME : a fast emulation based fault injection control and monitoring enhancementAbideen, Zain Ul; Rashid, Muhammad HaroonIEEE Access2020 / p. 207705-207716 https://doi.org/10.1109/ACCESS.2020.3038198 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

125

artikkel ajalehes

Eksperdid: päikesetormide mõju pärast tänapäeval enam muretsema ei peaPiir, Raitnovaator.err.ee2024 Eksperdid: päikesetormide mõju pärast tänapäeval enam muretsema ei pea

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