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32176

artikkel ajakirjas

Hierarchical approaches to test generation and fault simulationUbar, Raimund-JohannesRadioelectronics and informatics2003 / p. 204

artikkel ajakirjas

32177

artikkel kogumikus

Hierarchical attention network to manage processing resources of CPSsTammemäe, KalleSelPhyS Program2017 https://www.ict.tuwien.ac.at/selphys2017/program

artikkel kogumikus

32178

artikkel kogumikus

A hierarchical automatic test pattern generator based on using alternative graphsBrik, Marina; Jervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 19971997 / p. 415-420

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32179

artikkel kogumikus

Hierarchical calculation of malicious faults for evaluating the fault-toleranceUbar, Raimund-Johannes; Devadze, Sergei; Jenihhin, Maksim; Raik, Jaan; Jervan, Gert; Ellervee, PeeterProceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China2008 / p. 222-227 : ill https://ieeexplore.ieee.org/document/4459544

artikkel kogumikus

32180

artikkel ajakirjas

Hierarchical conceptual clustering based on quantile method for identifying microscopic details in distributional dataUmbleja, Kadri; Ichino, Manabu; Yaguchi, HiroyukiAdvances in data analysis and classification2020 / 30 p. : ill https://doi.org/10.1007/s11634-020-00411-w

artikkel ajakirjas

32181

artikkel kogumikus

Hierarchical concurrent test generation for synchronous sequential circuitsUbar, Raimund-Johannes; Brik, MarinaProceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 20002000 / p. 533-538 : ill

artikkel kogumikus

32182

artikkel kogumikus

Hierarchical defect level test quality analysisBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesVILAB User Forum2000 / [11] p

artikkel kogumikus

32183

artikkel kogumikus

Hierarchical defect-oriented fault simulation for digital circuitsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop : 23-26 May 2000, Cascais, Portugal : ETW 2000 : proceedings2000 / p. 69-74 : ill https://ieeexplore.ieee.org/document/873781

artikkel kogumikus

32184

artikkel kogumikus

Hierarchical defect-oriented fault simulation for digital circuitsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 151-156 https://ieeexplore.ieee.org/document/873781

artikkel kogumikus

32185

artikkel kogumikus

Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patternsUbar, Raimund-Johannes; Jutman, ArturProceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 19991999 / p. 437-442 : ill https://www.sciencedirect.com/science/article/pii/S0026271499002036

artikkel kogumikus

32186

artikkel kogumikus

A hierarchical Dirichlet process model for joint part-of-speech and morphology inductionSirts, Kairit; Alumäe, TanelNAACL HLT 2012 : the 2012 Conference of the North American Chapter of the Association for Computational Linguistics : Human Language Technologies : proceedings of the conference : June 3-8, 2012, Montreal, Canada2012 / p. 407-416 : ill https://www.researchgate.net/publication/262277910_A_hierarchical_Dirichlet_process_model_for_joint_part-of-speech_and_morphology_induction

artikkel kogumikus

32187

artikkel kogumikus

Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Evartson, Teet; Lensen, Harri; Aarna, Margit5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada2007 / [6] p. [CD-ROM]

artikkel kogumikus

32188

artikkel kogumikus

Hierarchical fault simulation for finite state machinesBrik, Marina; Raik, Jaan; Ubar, Raimund-JohannesThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 145-148 : ill

artikkel kogumikus

32189

artikkel kogumikus

Hierarchical fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaInternational Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings2001 / p. 181-184 : ill

artikkel kogumikus

32190

artikkel kogumikus

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

artikkel kogumikus

32191

artikkel kogumikus

Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

artikkel kogumikus

32192

artikkel kogumikus

Hierarchical language for development of distributed algorithmsKaldma, TarmoProceedings of the Fourth Symposium on Programming Languages and Software Tools, Visegrad, Hungary, June 9-10, 19951995 / p. 195-208

artikkel kogumikus

32193

artikkel kogumikus

Hierarchical language for development of distributed algorithmsKaldma, TarmoThe 3rd Baltic Summer School on Information Technology and Systems Engineering, 1-5 August, 1995, Klaipeda : theses1995 / p. 25-28

artikkel kogumikus

32194