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13101

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DeepFlexiHLS : Deep Neural Network Flexible High-Level Synthesis Directive GeneratorRiazati, Mohammad; Daneshtalab, Masoud; Sjödin, Mikael; Lisper, BjörnRiazati, M.; Daneshtalab, M.; Sjodin, M.; Lisper, B.2022 / p. 1-6 https://doi.org/10.1109/NorCAS57515.2022.9934617

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13102

artikkel kogumikus

DeepHLS: A complete toolchain for automatic synthesis of deep neural networks to FPGARiazati, Mohammad; Daneshtalab, Masoud; Sjodin, Mikael; Lisper, BjornICECS 2020 - 27th IEEE International Conference on Electronics, Circuits and Systems, November 23-25, 2020, Virtual Conference : Proceedings2020 / 4 p https://doi.org/10.1109/ICECS49266.2020.9294881

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13103

artikkel kogumikus

Deep-learning based blood cells classification and initial edge device implementationIslam, Md. Raisul; Le Moullec, Yannick; Afrin, Fariha; Ahmed, Faisal2022 18th Biennial Baltic Electronics Conference (BEC)2022 / 6 p. : ill https://doi.org/10.1109/BEC56180.2022.9935610

artikkel kogumikus

13104

artikkel ajakirjas

Deep-level photoluminescence of doped CdTe in 0,8 eV regionKrustok, Jüri; Lõo, A.; Piibe, ToomasJournal of physics and chemistry of solids1991 / 8, p. 1037-1038

artikkel ajakirjas

13105

artikkel ajalehes

Deeptech Sandbox toob Eestisse süvatehnoloogia eksperdid tippkeskustest üle Euroopa : Järgmisel Deeptech Sandboxil on kohal valdkonna tipptegijad Cambridge’i ülikoolistdigi.geenius.ee2023 Deeptech Sandbox toob Eestisse süvatehnoloogia eksperdid tippkeskustest üle Euroopa : Järgmisel Deeptech Sandboxil on kohal valdkonna tipptegijad Cambridge’i ülikoolist

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13106

artikkel ajakirjas EST / artikkel ajakirjas ENG

Deep-ultraviolet emitter : rare-earth-free ZnAl2O4 nanofibers via a simple wet chemical routeRojas Hernandez, Rocio Estefania; Rubio-Marcos, Fernando; Romet, Ivo; Del Campo, Adolfo; Gorni, Giulio; Hussainova, Irina; Fernandez, Jose Francisco; Nagirnyi, VitaliInorganic Chemistry2022 / p. 11886-11896 https://doi.org/10.1021/acs.inorgchem.2c01646 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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13107

artikkel kogumikus

DeepVigor: VulnerabIlity Value RanGes and FactORs for DNNs’ Reliability AssessmentAhmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, MaksimIEEE European Test Symposium (ETS) : Venice, Italy, 22-26 May 2023 : proceedings2023 / 6 p. : ill https://doi.org/10.1109/ETS56758.2023.10174133

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Seotud publikatsioonid 2

13108

artikkel ajakirjas

DeepVigor+: Scalable and Accurate Semi-Analytical Fault Resilience Analysis for Deep Neural NetworksAhmadilivani, Mohammad Hasan; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, MaksimarXiv.org2024 / 14 p. : ill https://doi.org/10.48550/arXiv.2410.15742

artikkel ajakirjas

Seotud publikatsioonid 1

Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks

13109

artikkel ajakirjas

Deering rohuniitja proovitööde valguselTehnika Põllumajanduses1939 / lk. 30

artikkel ajakirjas

13110

artikkel ajakirjas

[Deeringi reaskülvimasin]Uus Talu1927 / lk. 259 : fot

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13111

artikkel ajakirjas

"Deeringi" uus niidumasinPõllumees1932 / lk. 291-292 : joon

artikkel ajakirjas

13112

artikkel ajakirjas

"Deering-Mc Cormik" niidumasina 100 a. juubel 1831-1931Tehnika Põllumajanduses1931 / lk. 45-48 : fot

artikkel ajakirjas

13113

artikkel kogumikus

Defect analysis of renovated facade walls with etics solutions in cold climate conditionsLiisma, Eneli; Sepri, Raili; Raado, Lembi-Merike; Lill, Irene; Witt, Emlyn David Qivitoq; Sulakatko, Virgo; Põldaru, MattiasCESB 16 - Central Europe Towards Sustainable Building 2016 : Innovations for Sustainable Future : [book of abstracts]2016 / p. 65-66

artikkel kogumikus

13114

artikkel kogumikus

Defect analysis of renovated facade walls with etics solutions in cold climate conditions [Online resource]Liisma, Eneli; Sepri, Raili; Raado, Lembi-Merike; Lill, Irene; Witt, Emlyn David Qivitoq; Sulakatko, Virgo; Põldaru, MattiasCESB 16 - Central Europe Towards Sustainable Building 2016 : Innovations for Sustainable Future : [electronic proceedings]2016 / p. 174-181 : ill

artikkel kogumikus

13115

artikkel kogumikus

Defect oriented fault coverage of 100stuck-at fault test setsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 20002000 / p. 511-516 : ill https://repo.pw.edu.pl/info.seam?ps=20&id=WUT7e20f35d67ae45d3b2d1264d7a4ba722&lang=en&pn=1&cid=156607

artikkel kogumikus

13116

artikkel ajakirjas

Defect structure of Cl and Cu doped CdS heat treated in Cd and S2 vapourKukk, Peeter-Enn; Altosaar, MareJournal of solid state chemistry1983 / p. 1-11

artikkel ajakirjas

13117

artikkel ajakirjas

Defect structure of Cu‐doped cadmium selenideÖpik, Andres; Varvas, JüriPhysica status solidi (a) : applications and materials science1982 / p. 467-473 : ill https://doi.org/10.1002/pssa.2210740212 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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13118

artikkel ajakirjas

Defect structure of silver-doped cadmium tellurideNirk, TiitTallinna Tehnikaülikooli Toimetised1994 / lk. 3-12: ill

artikkel ajakirjas

13119

artikkel ajakirjas EST / artikkel ajakirjas ENG

Defect studies in Cu2ZnSnSe4 and Cu2ZnSn(Se0.75S0.25)4 by admittance and photoluminescence spectroscopyKask, Erkki; Grossberg, Maarja; Josepson, Raavo; Salu, Pille; Timmo, Kristi; Krustok, JüriMaterials science in semiconductor processing2013 / p. 992-996 : ill https://doi.org/10.1016/j.mssp.2013.02.009 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

13120

artikkel kogumikus

Defect-oriented BIST quality analysisKruus, Helena; Ubar, Raimund-Johannes; Raik, JaanBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 153-156 : ill

artikkel kogumikus

13121

artikkel kogumikus

Defect-oriented fault simulation and test generation in digital circuitsKuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California2001 / p. 365-371 https://ieeexplore.ieee.org/document/915257

artikkel kogumikus

13122

artikkel kogumikus

Defect-oriented library builder and hierarchical test generationCibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 163-168 : ill

artikkel kogumikus

13123

artikkel ajakirjas

Defect-oriented mixed-level fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaFacta Universitatis [Niš]. Series electronics and energetics2002 / 1, April, p. 123-136 : ill

artikkel ajakirjas

13124

artikkel kogumikus

Defect-oriented modul-level fault diagnosis in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 81-86

artikkel kogumikus

13125

artikkel kogumikus

Defect-oriented test- and layout-generation for standard-cell ASIC designsSudbrock, Joachim; Raik, Jaan; Ubar, Raimund-Johannes; Kuzmicz, Wieslaw; Pleskacz, Witold A.Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 79-82 : ill https://ieeexplore.ieee.org/document/1559781

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