List of Index: DOI
- https://doi.org//10.1109/TVLSI.2025.3534658 (1)
- https://doi.org//10.1109/VLSI-SoC62099.2024.10767798 (1)
- https://doi.org//10.1371/journal.pone.0300100 (1)
- https://doi.org//10.21203/rs.3.rs-4705729/v1 (1)
- https://doi.org//10.2139/ssrn.4506432 (1)
- https://doi.org//10.23919/DATE58400.2024.10546824 (1)
- https://doi.org//10.2478/iclr-2024-0016 (1)
- https://doi.org//10.3176/proc.2025.2.11 (1)
- https://doi.org//10.3233/SHTI240352 (1)
- https://doi.org//10.3389/fdgth.2024.1480600 (1)
- https://doi.org//10.35490/EC3.2023.204 (1)
- https://doi.org//10.35490/EC3.2023.282 (1)
- https://doi.org//10.3726/b18776 (1)
- https://doi.org//10.6531/JFS.202412_29(2).0005 (1)
- https://doi.org//doi.org/10.1109/SSI65953.2025.11107215 (1)
- https://doi.org/0.3303/CET2081143 (1)
- https://doi.org/0.3303/CET2081161 (1)
- https://doi.org/0.3303/CET2081162 (1)
- https://doi.org/10.0.4.125/06447.0015ecst (1)
- https://doi.org/10.1002/1873-3468.14994 (1)
- https://doi.org/10.1002/2013JC009192 (1)
- https://doi.org/10.1002/2013JD020818 (1)
- https://doi.org/10.1002/2013JD020930 (1)
- https://doi.org/10.1002/2014JC010320 (1)
- https://doi.org/10.1002/2015EA000105 (1)
Number of records 12345, displaying
51 - 75