List of Index: DOI
- https://doi.org//10.1063/5.0152628 (1)
- https://doi.org//10.1109/ACCESS.2023.3302348 (1)
- https://doi.org//10.1109/ACCESS.2024.3399168 (1)
- https://doi.org//10.1109/ACCESS.2025.3532858 (1)
- https://doi.org//10.1109/ATS64447.2024.10915463 (1)
- https://doi.org//10.1109/CPE-POWERENG58103.2023.10227480 (1)
- https://doi.org//10.1109/DDECS57882.2023.10139468 (1)
- https://doi.org//10.1109/ICEDEG52154.2021.9530954 (1)
- https://doi.org//10.1109/ICEET60227.2023.10526157 (1)
- https://doi.org//10.1109/RTUCON53541.2021.9711711 (1)
- https://doi.org//10.1109/TCAD.2018.2889772 (1)
- https://doi.org//10.1109/TCSII.2023.3273821 (1)
- https://doi.org//10.1109/TVLSI.2025.3534658 (1)
- https://doi.org//10.1109/VLSI-SoC62099.2024.10767798 (1)
- https://doi.org//10.1371/journal.pone.0300100 (1)
- https://doi.org//10.2139/ssrn.4506432 (1)
- https://doi.org//10.2478/iclr-2024-0016 (1)
- https://doi.org//10.3176/proc.2025.2.11 (1)
- https://doi.org//10.3233/SHTI240352 (1)
- https://doi.org//10.3389/fdgth.2024.1480600 (1)
- https://doi.org//10.3726/b18776 (1)
- https://doi.org//10.6531/JFS.202412_29(2).0005 (1)
- https://doi.org//10.21203/rs.3.rs-4705729/v1 (1)
- https://doi.org//10.23919/DATE58400.2024.10546824 (1)
- https://doi.org//10.35490/EC3.2023.204 (1)
Number of records 12313, displaying
1026 - 1050