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A novel fault-tolerant logic style with self-checking capability

author
Taheri, Mahdi
Sheikhpour, Saeideh
Mahani, Ali
Jenihhin, Maksim
statement of authorship
Taheri, Mahdi, Sheikhpour, Saeideh, Mahani, Ali, Jenihhin, Maksim
source
Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022
location of publication
Piscataway, New Jersey
publisher
IEEE
year of publication
2022
pages
art. 183305 : ill
conference name, date
28th IEEE International Symposium on On-Line Testing and Robust System Design, 12-14 Sept. 2022
conference location
Torino, Italy
url
https://doi.org/10.1109/IOLTS56730.2022.9897818
subject term
elektronahelad
veaavastus
enesekontroll
Scopus
Scopus
keyword
Digital circuits
error detection
logic level
self-checking
ISBN
978-166547355-2
notes
Bibliogr.: 27 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
3.1
TTÜ department
arvutisüsteemide instituut
language
inglise
Uurimisrühm
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Taheri, M., Sheikhpour, S., Mahani, A., Jenihhin, M. A novel fault-tolerant logic style with self-checking capability // Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022. Piscataway, New Jersey : IEEE, 2022. art. 183305 : ill. https://doi.org/10.1109/IOLTS56730.2022.9897818