Centre for trustworthy and efficient computing hardware (TECH)
TalTech priority area
Research classification (Frascati)
Head of the research group
Research group member
Doctoral students
Keyword
hardware design
cost-efficient computing
trust-efficient computing
functional safety
system health awareness
embedded systems
intelligent autonomous systems
Overview
The Research Centre focuses on cross-layer reliability and self-health awareness technologyfor tomorrow’s complex intelligent autonomoussystems and IoT edge devices in Estonia andEU. The team studies advanced cyber-physicalsystems characterized by their heterogeneity andthe emerging computing architectures employingAI-based autonomy. The centre generates knowledge to equip engineers with design-phase solutions and in-field instruments for industry-scalesystems to facilitate system’s crashless operation.The core competences of the group are: Hardware design- VHDL and Verilog designs- EDA tools (Cadence, Siemens, Synopsys platforms)- Application-specific computing platforms (Unmanned Aerial Vehicles) FPGA-based solutions and methodologies- FPGA SoCs (Zynq, CycloneV)- EDA tools (Xilinx Vivado, Altera/IntelQuartus, Lattice Diamond) Software and embedded SW development- Bare-metal applications, bootloaders,Linux drivers and Userspace applications,- Petalinux, Yocto, FreeRTOS and embedded SDKs, ELDK Cross-layer reliability and fault management- ML-based solutions- Functional Safety (ISO26262) Test strategy development and troubleshooting instrumentation- JTAG/IJTAG based solutions (standardsIEEE-1149.1, IEEE-1149.6, IEEE-1687)
Important results
Ahmadilivani, M. H.; Taheri, M.; Raik, J.; Daneshtalab, M.; Jenihhin, M. (2023). DeepVigor: VulnerabIlity Value Ranges and Factors for DNNs’ Reliability Assessment. In: 28th IEEE European Test Symposium (ETS), Venice, Italy, May 22-26, 2023. (1−6). IEEE. DOI: 10.1109/ETS56758.2023.10174133
Selg, H.; Jenihhin, M.; Ellervee, P.; Raik, J. (2023). ML-Based Online Design Error Localization for RISCV Implementations. IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS): Crete, Greece, 03-05 July 2023. IEEE, 1−7. DOI: 10.1109/IOLTS59296.2023.10224864
Related projects
Related department
Publications related to the research group
- Ahmed, F., Jenihhin, M. A survey on UAV computing platforms : a hardware reliability perspective // Sensors (2022) vol. 22, 16, art. 6286.
https://doi.org/10.3390/s22166286 - Gürsoy, C.C., Kraak, D., Ahmed, F., Taouil, M., Jenihhin, M., Hamdioui, S. On BTI aging rejuvenation in memory address decoders // 2022 IEEE 23rd Latin American Test Symposium, LATS 2022. Piscataway, NJ : IEEE, 2022. Code 184360.
https://doi.org/10.1109/LATS57337.2022.9936940 - Nosrati, N., Jenihhin, M., Navabi, Z. MLC: a machine learning based checker for soft error detection in embedded processors // Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022. New York : IEEE, 2022. Code 183305.
https://doi.org/10.1109/IOLTS56730.2022.9897309 - Gazori, P., Rahbari, D., Nickray, M. Saving time and cost on the scheduling of fog-based IoT applications using deep reinforcement learning approach // Future generation computer systems (2020) vol. 110, p. 1098-1115.
https://doi.org/10.1016/j.future.2019.09.060 - Rahbari, D., Nickray, M. Task offloading in mobile fog computing by classification and regression tree // Peer-to-Peer networking and applications (2020) vol. 13, 1, p. 104−122.
https://doi.org/10.1007/s12083-019-00721-7 - Kuts, V., Cherezova, N., Sarkans, M., Otto, T. Digital Twin : industrial robot kinematic model integration to the virtual reality environment // Journal of machine engineering (2020) vol. 20, 2, p. 53–64.
https://doi.org/10.36897/jme/120182 - Selg, H., Jenihhin, M., Ellervee, P. Wafer-level die re-test success prediction using machine learning // 21st IEEE Latin-American Test Symposium (LATS) 2020 : proceedings. Danvers : IEEE, 2020. 5 p.
https://doi.org/10.1109/LATS49555.2020.9093672 - Rahbari, D. Analyzing meta-heuristic algorithms for task scheduling in a fog-based IoT application // Algorithms (2022) vol. 15, 11, art. 397.
https://doi.org/10.3390/a15110397 - Augusto da Silva, F., Bagbaba, A. C., Sartoni, S., Cantoro, R., Reorda, M. S., Hamdioui, S., Sauer, C. Determined-safe faults identification : a step towards ISO26262 hardware compliant designs // 2020 25th IEEE European Test Symposium (ETS). : IEEE, 2020. 6 p. : ill.
https://doi.org/10.1109/ETS48528.2020.9131568 - Balakrishnan, A., Lange, T., Glorieux, M., Alexandrescu, D., Jenihhin, M. Composing graph theory and deep neural networks to evaluate SEU type soft error effects // 9th Mediterranean Conference on Embedded Computing (MECO'2020), Budva, Montenegro, 8-11 June 2020. Danvers : IEEE, 2020.
https://doi.org/10.1109/MECO49872.2020.9134279 - Rahbari, D., Alam, M. M., Le Moullec, Y., Jenihhin, M. Fast and fair computation offloading management in a swarm of drones using a rating-based federated learning approach // IEEE Access (2021) vol. 9, p. 113832-113849.
https://doi.org/10.1109/ACCESS.2021.3104117 - Cardoso Medeiros, G., Gürsoy, C.C., Fieback, M., Jenihhin, M. et al. A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMs // 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings. : EDAA, 2020. p. 792-797.
https://doi.org/10.23919/DATE48585.2020.9116278 - Lange, T., Balakrishnan, A., Glorieux, M. et al. Machine learning clustering techniques for selective mitigation of critical design features // Proceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition. Danvers : IEEE, 2020. 7 p. : ill.
https://doi.org/10.1109/IOLTS50870.2020.9159751 - Silva, F. A., Bagbaba, A. C., Ruospo, A., Jenihhin, M. et al. Special session : AutoSoC - a suite of open-source automotive SoC benchmarks // 2020 IEEE 38th VLSI TEST SYMPOSIUM (VTS) - VTS 2020 : proceedings. Danvers : IEEE, 2020. 9 p. : ill.
https://doi.org/10.1109/VTS48691.2020.9107599 - Tarique, T. A., Ahmed, F., Jenihhin, M., Ali, L. Unsupervised recycled FPGA detection using symmetry analysis // 12th International Conference on Electrical and Computer Engineering : ICECE 2022. : IEEE, 2022. p. 437-440.
https://doi.org/10.1109/ICECE57408.2022.10088856 - Rahbari, D., Alam, M. M., Le Moullec, Y., Jenihhin, M. Edge-to-Fog collaborative computing in a swarm of drones // Advances in Model and Data Engineering in the Digitalization Era : MEDI 2021 International Workshops: DETECT, SIAS, CSMML, BIOC, HEDA, Tallinn, Estonia, June 21–23, 2021 : proceedings. Cham : Springer, 2021. p. 78–87. (Communications in computer and information science ; 1481).
https://doi.org/10.1007/978-3-030-87657-9_6 - Oyeniran, A.S., Ubar, R., Jenihhin, M., Raik, J. High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors // Journal of electronic testing : theory and applications (2020) vol. 36, p. 87-103.
https://doi.org/10.1007/s10836-020-05856-7 - Oyeniran, A.S., Ubar, R., Jenihhin, M., Raik, J. Implementation-independent functional test for transition delay faults in microprocessors // 2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia. Danvers : IEEE, 2020. p. 646-650.
https://doi.org/10.1109/DSD51259.2020.00105 - Lai, X., Jenihhin, M., Selimis, G. et al. Early RTL analysis for SCA vulnerability in fuzzy extractors of memory-based PUF enabled devices // arXiv.org (2020) arXiv:2008.08409v1, 6 p. : ill.
https://doi.org/10.48550/arXiv.2008.08409 https://arxiv.org/abs/2008.08409 - Jürimägi, L., Ubar, R., Jenihhin, M., Raik, J. Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs // Microprocessors and microsystems (2020) vol. 77, art. 103117, 12 p.
https://doi.org/10.1016/j.micpro.2020.103117 - Heidari Iman, M.R., Raik, J., Jenihhin, M., Jervan, G., Ghasempouri, T. A methodology for automated mining of compact and accurate assertion sets // 2021 IEEE Nordic Circuits and Systems Conference (NorCAS) : Oslo, Norway, October 26-27. : IEEE, 2021. 7 p. : ill.
https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=9599865 https://doi.org/10.1109/NorCAS53631.2021.9599865 - Isaka, Y., Shintani, M., Ahmed, F. Inoue, M. Systematic unsupervised recycled field-programmable gate array detection // IEEE transactions on device and materials reliability (2022) vol. 22, 2, 10 p. : ill.
https://doi.org/10.1109/TDMR.2022.3164788 - Bagbaba, A.C., Augusto da Silva, F., Sonza Reorda, M., Hamdioui, S., Jenihhin, M., Sauer, C. Automated identification of application-dependent safe faults in automotive systems-on-a-chips // Electronics (2022) vol. 11, 3, art. 319.
https://doi.org/10.3390/electronics11030319 - Balakrishnan, A., Medeiros, G.C., Gürsoy, C.C., Hamdioui, S., Jenihhin, M., Alexandrescu, D. Modeling soft-error reliability under variability // 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 2021. : IEEE, 2021. p. 1-6.
https://doi.org/10.1109/DFT52944.2021.9568295 - Bagbaba, A.C., Jenihhin, M., Ubar, R., Sauer, C. Representing gate-level SET faults by multiple SEU faults on RT-level // 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings. Danvers : IEEE, 2020. art. 19889351, 6 p. : ill.
https://doi.org/10.1109/IOLTS50870.2020.9159715 - Oyeniran, A. S., Ademilua, T., Kruus, M., Ubar, R. Environment for innovative university research training in the field of digital test // 2021 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE). : IEEE, 2021.
https://doi.org/10.1109/EAEEIE50507.2021.9531003 - Selg, H., Jenihhin, M., Ellervee, P. JÄNES : a NAS framework for ML-based EDA applications // IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. : IEEE, 2021.
https://doi.org/10.1109/DFT52944.2021.9568321 - Alexandrescu, D., Balakrishnan, A., Lange, T., Glorieux, M. Enabling cross-layer reliability and functional safety assessment through ML-based compact models // Proceedings : 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design : IOLTS 2020, Napoli, Italy, July 13-16, 2020 : virtual edition. Danvers : IEEE, 2020. 6 p. : ill.
https://doi.org/10.1109/IOLTS50870.2020.9159750 - Lai, X., Lange, T., Balakrishnan, A., Alexandrescu, D., Jenihhin, M. On antagonism between side-channel security and soft-error reliability in BNN inference engines // IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC). : IEEE, 2021. p. 1-6.
https://doi.org/10.1109/VLSI-SoC53125.2021.9606981 - Jenihhin, M., Hamdioui, S., Sonza Reorda, M., Raik J. et al. RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systems // 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings. Danvers : EDAA, 2020. art. 19690741 , 6 p.
https://doi.org/10.23919/DATE48585.2020.9116558 - Cherezova, N., Mihhailov, D., Devadze, S., Jutman, A. HLS-based optimization of tau triggering algorithm for LHC: a case study // 2022 18th Biennial Baltic Electronics Conference (BEC). : IEEE, 2022. 6 p. : ill.
https://doi.org/10.1109/BEC56180.2022.9935599 - Oyeniran, A.S., Jenihhin, M., Raik, J., Ubar, R. High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test // 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022. : IEEE, 2022. p. 32-37.
https://doi.org/10.1109/ISVLSI54635.2022.00019 - Balakrishnan, A., Alexandrescu, D., Jenihhin, M., Lange, T., Glorieux, M. Gate-level graph representation learning : a step towards the improved stuck-at faults analysis // Proceedings of the Twenty Second International Symposium on Quality Electronic Design (ISQED) : Santa Clara, USA, 7-9 April 2021. : IEEE, 2021. p. 24-30.
https://doi.org/10.1109/ISQED51717.2021.9424256 - Taheri, M., Sheikhpour, S., Mahani, A., Jenihhin, M. A novel fault-tolerant logic style with self-checking capability // Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022. Piscataway, New Jersey : IEEE, 2022. art. 183305 : ill.
https://doi.org/10.1109/IOLTS56730.2022.9897818 - Jenihhin, M., Oyeniran, A. S., Raik, J., Ubar, R. Implementation-independent test generation for a large class of faults in RISC processor modules // 24th Euromicro Conference on Digital System Design (DSD). : IEEE, 2021.
https://doi.org/10.1109/DSD53832.2021.00090 - Oyeniran, A.S., Ubar, R., Jenihhin, M., Raik, J. On test generation for microprocessors for extended class of functional faults // VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers. Cham : Springer Nature, 2020. p. 21-44.
https://doi.org/10.1007/978-3-030-53273-4 - Oyeniran, A. S., Ubar, R. High-level functional test generation for microprocessor modules // Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019. Lodz : Lodz University of Technology, 2019. p. 356-361 : ill.
https://doi.org/10.23919/MIXDES.2019.8787131 - Jürimägi, L., Ubar, R. Algorithm for restructuring of structurally synthesized BDDs // 2019 IEEE 31st International Conference on Microelectronics : Niš, Serbia September 16th-18th, 2019 : proceedings. Danvers : IEEE, 2019. p. 239-242 : ill.
https://doi.org/10.1109/MIEL.2019.8889578 - Jürimägi, L., Ubar, R. Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource] // BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018. : IEEE, 2018. 4 p. : ill.
https://doi.org/10.1109/BEC.2018.8600967 - Vain, J., Tsiopoulos, L., Kharchenko, V., Kaur, A., Jenihhin, M., Raik, J., Nõmm, S. Energy-efficient multi-fragment Markov model guided online model-based testing for MPSoC // Green IT Engineering: Social, Business and Industrial Applications. Cham : Springer Nature, 2019. p. 273-297. (Studies in systems, decision and control ; 171).
https://doi.org/10.1007/978-3-030-00253-4_12 - Azad, S.P., Oyeniran, A.S., Ubar, R. Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells // 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings. Piscataway : IEEE, 2018. p. 21-26 : ill.
https://doi.org/10.1109/DDECS.2018.00011 - Damljanovic, A., Squillero, G., Gürsoy, C. C., Jenihhin, M. On NBTI-induced aging analysis in IEEE 1687 reconfigurable scan networks // VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]. Piscataway : IEEE, 2019. p. 335-340 : ill.
https://doi.org/10.1109/VLSI-SoC.2019.8920313 - Eggersgluss, S., Hamdioui, S., Jutman, A., Michael, M.K., Raik, J. et al. IEEE European Test Symposium (ETS) // 2019 IEEE International Test Conference (ITC). [S.l.] : IEEE, 2019. 4 p.
https://doi.org/10.1109/ITC44170.2019.9000148 - Ubar, R., Oyeniran, A.S., Medaiyese, O. Minimization of the high-level fault model for microprocessor control parts [Online resource] // BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018. : IEEE, 2018. 4 p.: ill.
https://doi.org/10.1109/BEC.2018.8600980 - Jürimägi, L., Ubar, R., Viies, V. Equivalent transformations of structurally synthesized BDDs and applications // 2019 8th Mediterranean Conference on Embedded Computing (MECO). [S.l.] : IEEE, 2019. 6 p. : ill.
https://doi.org/10.1109/MECO.2019.8760283 - Vain, J., Kaur, A., Tsiopoulus, L., Raik, J., Jenihhin, M. Multi-view modeling for MPSoC design aspects [Online resource] // BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018. : IEEE, 2018. 4 p.: ill.
https://doi.org/10.1109/BEC.2018.8600986 - Bagbaba, A. C., Jenihhin, M., Raik, J., Sauer, C. Efficient fault injection based on dynamic HDL slicing technique // 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece. Piscataway : IEEE, 2019. p. 52-53 : ill.
https://doi.org/10.1109/IOLTS.2019.8854419 - Kõusaar, J., Ubar, R.-J., Kostin, S., Devadze, S., Raik, J. Parallel critical path tracing fault simulation in sequential circuits // Proceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 2018. Lodz : Lodz University of Technology, 2018. p. 305-310 : ill.
https://doi.org/10.23919/MIXDES.2018.8436880 - Odintsov, S. In-field detection of degradation on PCB assembly high-speed buses // IEEE AUTOTESTCON 2018 : National Harbor, September 17-20, 2018 : proceedings. Piscataway : IEEE, 2018. 6 p.: ill.
https://doi.org/10.1109/AUTEST.2018.8532547 - Ehrenberg, H., Odintsov, S., Devadze, S., Jutman, A., Aleksejev, I., Wenzel, T. Ways for board and system test to benefit from FPGA embedded instrumentation // 2019 IEEE AUTOTESTCON. [S.l.] : IEEE, 2019. 10 p : ill.
https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057 - Ubar, R., Jürimägi, L., Jenihhin, M., Raik, J., Olugbenga, N.-L., Viies, V. Timing-critical path analysis with structurally synthesized BDDs // 2018 7th Mediterranean Conference on Embedded Computing (MECO). New York : IEEE, 2018. 6 p. : ill.
https://doi.org/10.1109/MECO.2018.8406051 - Vierhaus, H. T. Jenihhin, M., Sonza Reorda, M. RESCUE : cross-sectoral PhD training concept for interdependent reliability, security and quality // 2018 12th European Workshop on Microelectronics Education (EWME) : September 24–26, 2018. Danvers : IEEE, 2018. p. 45-50 : ill.
https://doi.org/10.1109/EWME.2018.8629465 - Jürimagi, L., Ubar, R., Jenihhin, M., Raik, J., Devadze, S., Kostin, S. Hierarchical timing-critical paths analysis in sequential circuits // 2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS 2018) : 2 – 4 July 2018, Spain. : IEEE, 2018. 6 p. : ill.
https://doi.org/10.1109/PATMOS.2018.8464176 - Naqvi, S. R., Anjum, Z., Sawalha, L., Jenihhin, M. et al. An optimization framework for dynamic pipeline management in computing systems // Computers & electrical engineering (2019) vol. 78, p. 242-258 : ill.
https://doi.org/10.1016/j.compeleceng.2019.07.013 - Avramenko, S., Azad, S. P., Violante, M., Niazmand, B.,Raik, J., Jenihhin, M. Upgrading QoSinNoC : efficient routing for mixed-criticality applications and power analysis // Proceedings of the 2018 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : October 8-10, 2018, Verona, Italy. : IEEE, 2018. p. 207-212 : ill.
https://doi.org/10.1109/VLSI-SoC.2018.8644866 - Oyeniran, A. S., Ubar, R., Jenihhin, M., Gürsoy, C. C., Raik, J. Mixed-level identification of fault redundancy in microprocessors // LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile,
March 11th - 13th 2019. [S.l.] : IEEE, 2019. 6 p. : ill.
https://doi.org/10.1109/LATW.2019.8704591 - Damljanovic, A., Jutman, A., Portolan, M., Tšertov, A. et al. Simulation-based equivalence checking between IEEE 1687 ICL and RTL // 2019 IEEE International Test Conference (ITC). [S.l.] : IEEE, 2019. paper. 7.3, 8 p. : ill.
https://doi.org/10.1109/ITC44170.2019.9000181 - Ubar, R., Kostin, S., Jenihhin, M., Raik, J., Jürimägi, L. Fast identification of true critical paths in sequential circuits // Microelectronics reliability (2018) vol. 81, p. 252-261 : ill.
https://doi.org/10.1016/j.microrel.2017.11.027 - Odintsov, S., Bozzoli, L., De Sio, C., Sterpone, L., Jutman, A. A new FPGA-based detection method for spurious variations in PCBA power distribution network // 2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings. Danvers : IEEE, 2019. 6 p. : ill.
https://doi.org/10.1109/DDECS.2019.8724662 - Janson, K., Treudler, C.J., Hollstein, T., Raik, J., Jenihhin, M., Fey, G. Software-level TMR approach for on-board data processing in space applications // 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings. Piscataway : IEEE, 2018. p. 147-152 : ill.
https://doi.org/10.1109/DDECS.2018.00033 - Yousefzadeh, S., Basharkhah, K., Raik, J., Jenihhin, M. et al. An Accelerator-based architecture utilizing an efficient memory link for modern computational requirements // 2019 IEEE East-West Design & Test Symposium (EWDTS). [S.l.] : IEEE, 2019. 6 p. : ill.
https://doi.org/10.1109/EWDTS.2019.8884481 - Augusto da Silva, F., Bagbaba, A. C., Hamdioui, S., Sauer, C. Efficient methodology for ISO26262 functional safety verification // 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Rhodes, Greece. : IEEE, 2019. p. 255-256.
https://doi.org/10.1109/IOLTS.2019.8854449 - Oyeniran, A. S., Ubar, R., Jenihhin, M., ; Gürsoy, C. C., Raik, J. High-level combined deterministic and pseudo-exhuastive test generation for RISC processors // 2019 IEEE European Test Symposium (ETS) : proceedings. Danvers : IEEE, 2019. 6 p. : ill.
https://doi.org/10.1109/ETS.2019.8791526 - Bagbaba, A. C., Jenihhin, M., Raik, J., Sauer, C. Accelerating transient fault injection campaigns by using Dynamic HDL Slicing // 2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore. Danvers : IEEE, 2019. 7 p. : ill.
https://doi.org/10.1109/NORCHIP.2019.8906932 - Ubar, R., Jürimägi, L., Oyeniran, A. S., Jenihhin, M. True path tracing in structurally synthesized BDDs for testability analysis of
digital circuits // Euromicro Conference on Digital System Design : DSD 2019 : 28 - 30 August 2019
Kallithea, Chalkidiki, Greece : proceedings. Danvers : IEEE, 2019. p. 492-499 : ill.
https://doi.org/10.1109/DSD.2019.00077 - Oyeniran, A.S., Azad, S.P., Ubar, R.-J. Combined pseudo-exhaustive and deterministic testing of array multipliers // 2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 21st edition, 24th-26th May, Cluj-Napoca, Romania : proceedings. Romania : IEEE, 2018. 6 p. : ill.
https://doi.org/10.1109/AQTR.2018.8402708 - Aleksandrowicz, G., Arbel, E., Bloem, R., Devadze, S., Jenihhin, M., Jutman, A., Raik, J., Shibin, K. et al. Designing reliable cyber-physical systems // Languages, design methods, and tools for electronic system design : selected contributions from FDL 2016. Cham : Springer, 2018. p. 15-38 : ill. (Lecture notes in electrical engineering; 454).
https://doi.org/10.1007/978-3-319-62920-9_2 - Kraak, D.H.P, Gürsoy, C.C., Jenihhin, M., Raik, J. et al. Software-based mitigation for memory address decoder aging // LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019. [S.l.] : IEEE, 2019. 6 p. : ill.
https://doi.org/10.1109/LATW.2019.8704595 - Balakrishnan, A., Lange, T., Glorieux, M., Alexandrescu, D., Jenihhin, M. The validation of graph model-based, gate level low-dimensional feature data for machine learning applications // 2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore. Danvers : IEEE, 2019. 7 p.
https://doi.org/10.1109/NORCHIP.2019.8906974 - Gürsoy, C., Jenihhin, M., Oyeniran, A.S., Piumatti, D., Raik, J., Sonza Reorda, M., Ubar, R. New categories of Safe Faults in a processor-based Embedded System // 2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings. Danvers : IEEE, 2019. 4 p. : ill.
https://doi.org/10.1109/DDECS.2019.8724642 - Jürimägi, L., Ubar, R., Jenihhin, M., Raik, J., Devadze, S., Oyeniran, A. Application specific true critical paths identification in sequential circuits // 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece. Piscataway : IEEE, 2019. p. 299-304 : ill.
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