Fast static compaction of test sequences using implications and greedy search
author
Raik, Jaan
Jutman, Artur
Ubar, Raimund-Johannes
statement of authorship
J.Raik, A.Jutman, R.Ubar
source
ETW 2001 : IEEE European Test Workshop : Stockholm, May 29 June 1, 2001 : informal digest
location of publication
[S. l.]
year of publication
2001
pages
p. 207-209 : ill
notes
Bibliogr.: 13 ref