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testimine (subject term)
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1
book article
A global methodology for test program generation starting from high level specifications
Storojev, Sergei
;
Leveugle, Regis
;
Saucier, Gabriele
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 305-311: ill
https://www.ester.ee/record=b2150914*est
book article
2
journal article
A knowledge-based approach to the specification-based program testing
Tepandi, Jaak
Computers and artificial intelligence = Вычислительные машины и искуственный интеллект = Pocitace a umela inteligencia
1988
/
p. 39-48
https://www.ester.ee/record=b1482459*est
journal article
3
book article
A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs
Benso, A.
;
Prinetto, Paolo
;
Rebaudengo, M.
;
Sonza, M.
;
Ubar, Raimund-Johannes
Proceedings IEEE European Design & Test Conference, Paris, March 17-20, 1997
1997
/
p. 560-565
https://ieeexplore.ieee.org/document/582417
book article
4
book article
A new measure for calculating multiple fault coverage of microprocessor self-test
Oyeniran, Adeboye Stephen
;
Odozi, Uzochukwu Eddie
;
Ubar, Raimund-Johannes
BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia
2016
/
p. 75-78 : ill
http://www.ester.ee/record=b2150914*est
book article
5
journal article
A new testability calculation method to guide RTL test generation
Raik, Jaan
;
Nõmmeots, Tanel
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2005
/
p. 71-82 : ill
https://doi.org/10.1007/s10836-005-5288-5
journal article
6
book article
A PC-based CAD system for training digital test
Ubar, Raimund-Johannes
;
Buldas, Ahto
;
Paomets, Priidu
;
Raik, Jaan
;
Tulit, Viljar
The Fifth EUROCHIP Workshop on VLSI Design Training, 17-18-19 October 1994, Dresden, Germany
1994
/
p. 152-157: ill
book article
7
book article
A proposal for optimisation of low-powered FSM testing
Brik, Marina
;
Fomina, Jelena
;
Ubar, Raimund-Johannes
Proceedings of IEEE East-West Design & Test Workshop (EWDTW'05) : Odessa, Ukraine, September 15-19, 2005
2005
/
p. 15-20
book article
8
book article
A study of the toxicity of the ozonation products of phenols and chlorophenols by daphnia magna test
Trapido, Marina
;
Veressinina, Jelena
23rd Estonian Chemistry Days : abstracts of scientific conference
1997
/
p. 152
book article
9
book article
A synthesis-agnostic behavioral fault model for high gate-level fault coverage
Karputkin, Anton
;
Raik, Jaan
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 14-18 March 2016, ICC, Dresden, Germany
2016
/
p. 1124-1127 : ill
https://ieeexplore.ieee.org/document/7459477/figures#figures
book article
10
book article
A testing strategy for interacting finite state machines
Yevtushenko, Nina
;
Petrenko, Alexandre
;
Trenkaev, Vadim
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 137-140: ill
book article
11
book article
Abrasivity study of materials used at abrasive tests
Kulu, Priit
;
Veinthal, Renno
;
Käerdi, Helmo
;
Tarbe, Riho
Tribology 2008 : proceedings of the 9th International Tribology Conference : University of Pretoria, South Africa, 2-4 April 2008
2008
/
p. 3.4(1)-3.4(10)
book article
12
journal article EST
/
journal article ENG
Adaptive Extended Kalman Filter position estimation based on Ultra-Wideband Active-Passive Ranging Protocol
Laadung, Taavi
;
Ulp, Sander
;
Fjodorov, Aleksei
;
Alam, Muhammad Mahtab
;
Le Moullec, Yannick
IEEE Access
2023
/
p. 92575-92588
https://doi.org/10.1109/ACCESS.2023.3308696
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
13
book article
Advances in moving speaker acoustic localization for operation in distributed systems
Astapov, Sergei
;
Berdnikova, Julia
;
Preden, Jürgo-Sören
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 9-12 : ill
book article
14
book article
AG-model for design of testable controllers
Kasirova, Lilia
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 303-306: ill
book article
15
book article EST
/
book article ENG
Air change efficiency of room ventilation units
Mikola, Alo
;
Rehand, Juhan
;
Kurnitski, Jarek
E3S Web of Conferences : CLIMA 2019 Congress, Bucharest, Romania, May 26-29, 2019
2019
/
art. 01017, 8 p
https://doi.org/10.1051/e3sconf/201911101017
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
Seotud publikatsioonid
1
Ventilation performance in deep renovation of multifamily apartment buildings = Terviklikult renoveeritud korterelamute ventilatsioonisüsteemide toimivus
16
journal article
Algorithms of functional level testability analysis for digital circuits
Ubar, Raimund-Johannes
;
Kuchcinski, Ktzysztof
Periodica polytechnica. Electrical engineering
1992
/
3/4, p. 295-308
journal article
17
book article
Alternative graphs as a mathematical tool and knowledge representation for diagnosis purposes in digital systems
Ubar, Raimund-Johannes
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 285-292: ill
book article
18
book article
An approach for PSL assertion coverage analysis with high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Shchenova, Tatjana
Proceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 2010
2010
/
p. 13-16 : ill
https://ieeexplore.ieee.org/document/5742048
book article
19
book article
An approach for verification assertions reuse in RTL test pattern generation
Jenihhin, Maksim
;
Raik, Jaan
;
Fujiwara, Hideo
;
Ubar, Raimund-Johannes
;
Viilukas, Taavi
Digest of papers : IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010, Shanghai, China
2010
/
p. 107-110 : ill
book article
20
book article
An approach to model development for embedded testing
Timohovich, E.
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 353-358
book article
21
book article
An aspect-oriented technique to model-based test design
Sarna, Külli
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa
2012
/
p. 77-80
book article
22
book article
An educational environment for digital testing : hardware, tools, and web-based runtime platform
Jutman, Artur
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Vislogubov, Vladislav
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 412-419 : ill
https://www.researchgate.net/profile/Artur-Jutman/publication/220880167_An_Educational_Environment_for_Digital_Testing_Hardware_Tools_and_Web-Based_Runtime_Platform/links/02e7e53c3c71b0b2a7000000/An-Educational-Environment-for-Digital-Testing-Hardware-Tools-and-Web-Based-Runtime-Platform.pdf
book article
23
book article
An external test approach for network-on-a-chip switches
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
ATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan
2006
/
p. 437-442 : ill
http://dx.doi.org/10.1109/ATS.2006.23
book article
24
book article
An external test approach for network-on-a-chip switches
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium
2011
/
p. 185-190 : ill
book article
25
book article
An overview of expert system testing with remarks on distributed architecture
Parmakson, Priit
;
Tepandi, Jaak
Proc. of the 11th Int. Scientific School on Distributed Information Systems Architecture, Wroclaw, 28.Jan.-1.Feb., 1990
1990
book article
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