An external test approach for network-on-a-chip switches
author
Raik, Jaan
Govind, Vineeth
Ubar, Raimund-Johannes
statement of authorship
Jaan Raik, Vineeth Govind, Raimund Ubar
source
ATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan
location of publication
Washington
publisher
IEEE Computer Society
year of publication
2006
pages
p. 437-442 : ill
conference name, date
15th Asian Test Symposium, November 20-23, 2006
conference location
Fukuoka, Japan
url
http://dx.doi.org/10.1109/ATS.2006.23
subject term
kiipvõrgud
integraallülitused
testimine
ISBN
0-7695-2628-4
notes
Bibliogr.: 14 ref
TalTech department
arvutitehnika instituut
language
inglise