RT-level identification of potentially testable initialization faults
author
Raik, Jaan
Fujiwara, Hideo
Krivenko, Anna
statement of authorship
J.Raik, H.Fujiwara, A.Krivenko
source
The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan
location of publication
Sapporo
year of publication
2008
pages
[6] p
url
https://www.researchgate.net/publication/234032548_RT-level_identification_of_potentially_testable_initialization_faults
subject term
rikked
avastamine
testimine
language
inglise