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Wideband frequency diagnosis for high-sensitivity turn-insulation degradation estimation in inverter-fed machines

author
Sardar, Muhammad Usman
Vaimann, Toomas
Kütt, Lauri
Asad, Bilal
Kallaste, Ants
Raja, Hadi Ashraf
statement of authorship
Muhammad Usman Sardar, Toomas Vaimann, Lauri Kütt, Bilal Asad, Ants Kallaste, Hadi Ashraf Raja
source
2025 IEEE Symposium on Diagnostics for Electric Machines, Power Electronics and Drives (SDEMPED) : proceedings
publisher
IEEE
year of publication
2025
pages
7 p
conference name, date
15th International 2025 IEEE Symposium on Diagnostics for Electrical Machines,Power Electronics and Drives (SDEMPED), 24-27 August 2025
conference location
Dallas, Texas, USA
url
https://doi.org/10.1109/SDEMPED53223.2025.11154298
Scopus
Conference paper at Scopus
keyword
common mode impedance
differential mode impedance
high-frequency machine modeling
induction machines
inverter drives
ISSN
2690-1188
ISBN
979-8-3503-8821-3
979-835038819-0
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
elektroenergeetika ja mehhatroonika instituut
language
Inglise
Sardar, M. U., Vaimann, T., Kütt, L., Asad, B., Kallaste, A., Raja, H. A. Wideband frequency diagnosis for high-sensitivity turn-insulation degradation estimation in inverter-fed machines // 2025 IEEE Symposium on Diagnostics for Electric Machines, Power Electronics and Drives (SDEMPED) : proceedings. : IEEE, 2025. 7 p. https://doi.org/10.1109/SDEMPED53223.2025.11154298