An approach for verification assertions reuse in RTL test pattern generation
author
Jenihhin, Maksim
Raik, Jaan
Fujiwara, Hideo
Ubar, Raimund-Johannes
Viilukas, Taavi
statement of authorship
Maksim Jenihhin, Jaan Raik, Hideo Fujiwara, Raimund Ubar, Taavi Viilukas
source
Digest of papers : IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010, Shanghai, China
location of publication
[Shanghai]
year of publication
2010
pages
p. 107-110 : ill
conference name, date
IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010
conference location
Shanghai, China
subject term
komplekssüsteemid
töökindlus
testimine
notes
Bibliogr.: 25 ref
language
inglise