A set of tools for estimating quality of built-in self-test in digital circuits
author
Jervan, Gert
Markus, Antti
Paomets, Priidu
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
G.Jervan, A.Markus, P.Paomets, J.Raik, R.Ubar
source
Proceedings of the International Symposium on Signals, Circuits and Systems, Iasi (Romania), October 2-3, 1997
location of publication
[S.l.]
year of publication
1997
pages
p. 362-365
language
inglise