Probabilistic equivalence checking based on high-level decision diagrams
author
Karputkin, Anton
Ubar, Raimund-Johannes
Tombak, Mati
Raik, Jaan
statement of authorship
Anton Karputkin, Raimund Ubar, Mati Tombak, Jaan Raik
source
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany
location of publication
[S.l.]
publisher
IEEE
year of publication
2011
pages
p. 423-428 : ill
conference name, date
IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011
conference location
Gottbus, Germany
url
https://ieeexplore.ieee.org/document/5783130
subject term
polünoomid
digitaaltehnika
andmestruktuurid
Boole'i funktsioonid
keerukusteooria
otsustusdiagrammid
ISBN
978-1-4244-9753-9
notes
Bibliogr.: 14 ref
language
inglise