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A new testability calculation method to guide RTL test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2005 / p. 71-82 : ill https://doi.org/10.1007/s10836-005-5288-5

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Application of high-level decision diagrams for simulation-based verification tasksJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesEstonian journal of engineering2010 / 1, p. 56-77 : ill

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Application of structurally synthesized binary decision diagrams for timing simulation of digital circuitsJutman, Artur; Ubar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering2001 / 4, p. 269-288 : ill

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Assertion checking with PSL and high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesDigest of papers IEEE 8th Workshop on RTL and High Level Testing : WRTLT'07 : October 12-13, 2007, Beijing, China2007 / p. 105-110 : ill https://pld.ttu.ee/~maksim/phd_papers/%5B12%5D%20wrtlt%2707.pdf

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Automated correction of design errors by edge redirection on high-level decision diagramsKarputkin, Anton; Ubar, Raimund-Johannes; Tombak, Mati; Raik, Jaan13th International Symposium on Quality Electronic Design (ISQED), 20122012 / p. 686-693 : ill https://ieeexplore.ieee.org/document/6113980

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Automated design error debug using high-level decision diagrams and mutation operatorsRaik, Jaan; Repinski, Urmas; Tšepurov, Anton; Hantson, Hanno; Ubar, Raimund-Johannes; Jenihhin, MaksimMicroprocessors and microsystems2013 / p. 505-513 : ill

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Automated software-based self-test generation for microprocessorsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonProceedings of the 24st International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2017 : Bydgoszcz, Poland, June 19-21, 20142017 / p. 453-458 : ill https://doi.org/10.23919/MIXDES.2017.8005252

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Automated test program synthesis for digital systems with high-level decision diagramsUbar, Raimund-JohannesProc. of 7th International Conference2005 / p. 171-180

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Automatic generation of EFSMs and HLDDs for functional ATPGTšepurov, Anton; Guglielmo, Giuseppe di; Raik, Jaan; Ubar, Raimund-Johannes; Viilukas, TaaviBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 143-146 : ill

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Canonical representations of high-level decision diagramsKarputkin, Anton; Ubar, Raimund-Johannes; Raik, Jaan; Tombak, MatiEstonian journal of engineering2010 / 1, p. 39-55 : ill

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Code coverage analysis on high level decision diagramsReinsalu, UljanaInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 56-59 : ill

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Code coverage analysis using high-level decision diagrams [Electronic resource]Raik, Jaan; Reinsalu, Uljana; Ubar, Raimund-Johannes; Jenihhin, Maksim; Ellervee, Peeter2008 IEEE Design and Diagnostics of Electronic Circuits and Systems : Bratislava, Slovakia, April 16-18, 20082008 / p. 201-207 : ill. [CD-ROM] https://ieeexplore.ieee.org/document/4538786

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DECIDER : a system for hierarchical test pattern generationRaik, Jaan; Ubar, Raimund-JohannesRadioelectronics and informatics2003 / p. 40-45 : ill https://www.researchgate.net/publication/250395975_DECIDER_A_System_for_Hierarchical_Test_Pattern_Generation

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Decision diagrams - from a mathematical notion to engineering applicationsStankovic, Radomir S.; Ubar, Raimund-Johannes; Astola, JaakkoFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 281-301 : ill http://dx.doi.org/10.2298/FUEE1103281S

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Decision diagrams and digital testUbar, Raimund-JohannesECMS 2003 : 6th International Workshop on Electronics, Control, Measurment and Signals : Liberec, Czechia, June 2-4, 20032003 / p. 266-273 : ill http://www.midem-drustvo.si/Journal%20papers/MIDEM_35(2005)4p187.pdf

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Decision diagrams and digital testUbar, Raimund-Johannes41th International Conference on Microelectronics, Devices and Materials : MIDEM 2005 : Ribno at Bled, Slovenia : invited plenary paper2005 / p. 15-26

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Decision diagrams for diagnostic modelingUbar, Raimund-JohannesMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 43

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Dependability evaluation in fault-tolerant systems with high-level decision diagramsUbar, Raimund-Johannes; Jervan, Gert; Raik, Jaan; Jenihhin, Maksim; Ellervee, PeeterComputer Science Meets Automation : 10-13 September 2007 : proceedings. Volume II2007 / p. 147-152 : ill https://www.db-thueringen.de/receive/dbt_mods_00008864

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Design error diagnosis using backtrace algorithm on decision diagramsRepinski, Urmas; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, Maksim; Tšepurov, AntonInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK neljanda aastakonverentsi artiklite kogumik : 26.-27. novembril 2010, Essu mõis2010 / p. 93-96

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Diagnostic modeling of digital systems with low- and high-level decision diagramsUbar, Raimund-JohannesLATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]2013 / [1] p

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Diagnostic modeling of digital systems with multi-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, MaksimDesign and test technology for dependable systems-on-chip2011 / p. 92-118 : ill https://www.researchgate.net/publication/344994231_Diagnostic_Modeling_of_Digital_Systems_with_Multi-Level_Decision_Diagrams

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Diagnostic modeling of microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Jutman, Artur; Jenihhin, Maksim; Brik, Marina; Istenberg, Martin; Wuttke, Heinz-DietrichBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 147-150 : ill

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Diagnostic modelling of digital systems with binary and high-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Kruus, Helena; Lensen, Harri; Evartson, TeetProgress in industrial mathematics at ECMI 20062008 / p. 902-907 : ill https://link.springer.com/chapter/10.1007/978-3-540-71992-2_158

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Diagnostic modelling of digital systems with decision diagramsUbar, Raimund-JohannesВестник Томского государственного университета : приложение2004 / август, материалы международных, всесоюзных и региональных научных конференций, симпозиумов, школ, проводимых в ТГУ, с. 174-179 : ил

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Diagnostic modelling of digital systems with multi-level decision diagramsUbar, Raimund-Johannes; Raik, Jaan; Evartson, Teet; Kruus, Margus; Lensen, HarriProceedings of the 17th IASTED International Conference on Modelling and Simulation : May 24-26, 2006, Montreal, Quebec, Canada2006 / p. 207-212 : ill

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