DefSim: measurement environment for CMOS defects
author
Borejko, Tomasz
Jutman, Artur
Pleskacz, Witold A.
Ubar, Raimund-Johannes
statement of authorship
T.Borejko, A.Jutman, W.A.Pleskacz, R.Ubar
source
2006 25th International Conference on Microelectronics : Belgrade, Serbia and Montenegro, 14-17 May 2006 : proceedings. Volume 2
location of publication
[Niš]
year of publication
2006
pages
p. 679-682
url
https://ieeexplore.ieee.org/document/1651048
subject term
integraallülitused
testimine
mõõtmine
vead
mikroelektroonika
language
inglise