Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuits
author
Kõusaar, Jaak
Ubar, Raimund-Johannes
Kostin, Sergei
Devadze, Sergei
Raik, Jaan
statement of authorship
Kõusaar, Jaak; Ubar, Raimund; Kostin, Sergei; Devadze, Sergei; Raik Jaan
source
International journal of microelectronics and computer science
journal volume number month
vol. 9, 1
year of publication
2018
pages
p. 9−18
url
https://ijmcs.dmcs.pl/web/guest/vol.-9-no.-1
https://ijmcs.dmcs.pl/documents/10630/345460/IJMCS_1_2018_2.pdf
subject term
rikked
elektronlülitused
diagnostika (tehnika)
kompuutersimulatsioon
keyword
sequential circuits
fault simulastion
stuck-at-faults
critical path tracing
ISSN
2080-8755
notes
Bibliogr.: 18 ref
TTÜ department
arvutisüsteemide instituut
language
inglise