Test set minimization using bipartite graphs
author
Markus, Antti
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
A.Markus, J.Raik, R.Ubar
source
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
location of publication
[Tallinn]
year of publication
1998
pages
p. 175-178: ill
ISBN
9985-59-081-3
notes
Bibl. 9 ref