Hierarchical test generation for complex digital systems with control and data processing parts
author
Ubar, Raimund-Johannes
Raik, Jaan
statement of authorship
R. Ubar, J. Raik
source
"Test, Assembly and Packaging" : SEMICON Technical Symposium : Singapur, May 3-6, 1999
location of publication
[S.l.]
publisher
SEMI
year of publication
1999
pages
p. 43-52
subject term
digitaaltehnika
testimine
testid
language
inglise