At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]
author
Gorev, Maksim
Ubar, Raimund-Johannes
Ellervee, Peeter
Devadze, Sergei
Raik, Jaan
Min, Mart
statement of authorship
Maksim Gorev, Raimund Ubar, Peeter Ellervee, Sergei Devadze, Jaan Raik, Mart Min
source
31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers
location of publication
Piscataway
publisher
IEEE
year of publication
2013
pages
p. 1-6 : ill [USB]
conference name, date
31st Norchip Conference, 11-12 November, 2013
conference location
Vilnius, Lithuania
subject term
integraallülitused
testimine
keyword
pipe-lined signal processing architectures
built-in self-test
at-speed testing
design for testability
ISBN
978-1-4799-1646-7
notes
Bibliogr.: 25 ref
TalTech department
arvutitehnika instituut
Thomas Johann Seebecki elektroonikainstituut
language
inglise