Mutation analysis for systemC designs at TLM
author
Guarnieri, Valerio
Bombieri, Nicola
Pravadelli, Graziano
Fummi, Franco
Hantson, Hanno
Raik, Jaan
Jenihhin, Maksim
Ubar, Raimund-Johannes
statement of authorship
Valerio Guarnieri, Nicola Bombieri, Graziano Pravadelli, Franco Fummi, Hanno Hantson, Jaan Raik, Maksim Jenihhin, Raimund Ubar
source
12th IEEE Latin American Test Workshop (LATW) : Porto de Galinhas, Brasil, 27-30 March 2011
location of publication
[S.l.]
publisher
IEEE
year of publication
2011
pages
[6] p
conference name, date
12th IEEE Latin American Test Workshop (LATW), 27-30 March 2011
conference location
Porto de Galinhas, Brasil
url
https://ieeexplore.ieee.org/document/5985925
subject term
digitaaltehnika
disain
riistvara
kodeerimine
testimine
keyword
mutation analysis
SystemC
TLM
RTL
ISBN
978-1-4577-1489-4
notes
Bibliogr.: 14 ref
language
inglise