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Characterization of deep level traps in semiconductor structures using numerical experiments

author
statement of authorship
A. Koel, T. Rang & G. Rang
source
location of publication
Southampton
publisher
year of publication
pages
p. 253-261 : ill
series
ISSN
1746-4471
ISBN
978-1-84564-948-7
notes
Bibliogr.: 3 ref
TTÜ department
language
inglise
Koel, A., Rang, T., Rang, G. Characterization of deep level traps in semiconductor structures using numerical experiments // Materials characterization VII. Southampton : WIT Press, 2015. p. 253-261 : ill. (WIT transactions on engineering sciences ; 90).