Characterization of deep level traps in semiconductor structures using numerical experiments

heading
Koel, A., Rang, T., Rang, G.
statement of authorship
A. Koel, T. Rang & G. Rang
location of publication
Southampton
publisher
year of publication
pages
p. 253-261 : ill
keyword
ISSN
1746-4471
ISBN
978-1-84564-948-7
notes
Bibliogr.: 3 ref
availibility
ei leidu TTÜ Raamatukogus
TTÜ department code
ie
country
gb
language
inglise
report field
välisp2015
aastar2015i
editor's notes
Pd 210116
Koel, A., Rang, T., Rang, G. Characterization of deep level traps in semiconductor structures using numerical experiments // Materials characterization VII. Southampton : WIT Press, 2015. p. 253-261 : ill. (WIT transactions on engineering sciences ; 90).