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Machine learning enabled fault-detection algorithms for optical spectrum-as-a-service users

author
statement of authorship
Sai Kireet Patri, Isabella Dick, Kaida Kaeval, Jasper Müller, Jose-Juan Pedreno-Manresa, Achim Autenrieth, Jörg-Peter Elbers, Marko Tikas, Carmen Mas-Machuca
source
2023 International Conference on Optical Network Design and Modeling (ONDM) : proceedings
publisher
year of publication
pages
6 p. : ill
conference name, date
International Conference on Optical Network Design and Modeling (ONDM), May 8-11, 2023
conference location
Coimbra, Portugal
url
ISBN
978-3-903176-54-6
notes
Bibliogr.: 14 ref
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
subject term
keyword
optical spectrum-as-a-service
optical networks
network monitoring
fault detection
machine learning (ML)
Scopus
Scopus
classifier
1.3
Patri, S. K., Dick, I., Kaeval, K., Müller, J., Pedreno-Manresa, J-J., Autenrieth, A., Elbers, J-P., Tikas, M., Mas-Machuca, C. Machine learning enabled fault-detection algorithms for optical spectrum-as-a-service users // 2023 International Conference on Optical Network Design and Modeling (ONDM) : proceedings. : IEEE, 2023. 6 p. : ill. https://ieeexplore.ieee.org/document/10144858