Liu, J.-G., Frühauf, U. - TalTech Research Portal

Testability-based parameter measurement of analog measuring circuits in the frequency domain

author

Liu, Ji-Gou

Frühauf, Uwe

statement of authorship

Ji-Gou Liu and Uwe Frühauf

source

BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings

location of publication

[Tallinn]

year of publication

1998

pages

p. 329-332: ill

ISBN

9985-59-081-3

notes

Bibl. 8 ref

Liu, J.-G., Frühauf, U. Testability-based parameter measurement of analog measuring circuits in the frequency domain // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 329-332: ill.