RT-level test point insertion for sequential circuits
author
Raik, Jaan
Govind, Vineeth
Ubar, Raimund-Johannes
statement of authorship
Jaan Raik, Vineeth Govind, Raimund Ubar
source
IWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings
location of publication
Piscataway
publisher
IEEE
year of publication
2004
pages
p. 34-40 : ill
conference name, date
IEEE 1st International Workshop on Testability Assessment, November 2, 2004
conference location
Rennes, France
url
https://ieeexplore.ieee.org/document/1428412
subject term
digitaaltehnika
elektriahelad
rikked
testimine
järjendanalüüs
süntees
ISBN
0-7803-8851-8
notes
Bibliogr.: 10 ref
language
inglise