Transition delay fault simulation with parallel critical path back-tracing and 7-valued algebra
author
Kõusaar, Jaak
Ubar, Raimund-Johannes
Devadze, Sergei
Raik, Jaan
statement of authorship
Jaak Kõusaar, Raimund Ubar, Sergei Devadze, Jaan Raik
source
Microprocessors and microsystems
publisher
Elsevier
journal volume number month
Vol. 39, 8
year of publication
2015
pages
p. 1130-1138 : ill
url
https://doi.org/10.1016/j.micpro.2015.05.003
subject term
elektronlülitused
rikked
diagnostika (tehnika)
kompuutermodelleerimine
algoritmid
keyword
transition delay faults
non-robust and functional sensitization
critical path fault tracing
7-valued algebra
ISSN
0141-9331
notes
Bibliogr.: 23 ref
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
https://www.scopus.com/sourceid/15552
https://www.scopus.com/record/display.uri?eid=2-s2.0-84949729637&origin=inward&txGid=e08d3c08f2a7669125f11489b8da9eb2
WOS
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=MICROPROCESS%20MICROSY&year=2015
https://www.webofscience.com/wos/woscc/full-record/WOS:000366879500049
category (general)
Computer science
Arvutiteadus
category (sub)
Computer science. Computer networks and communications
Arvutiteadus. Arvutivõrgud ja side
Computer science. Hardware and architecture
Arvutiteadus. Riistvara ja arhitektuur
Computer science. Software
Arvutiteadus. Tarkvara
Computer science. Artificial intelligence
Arvutiteadus. Tehisintellekt
quartile
Q2
TalTech department
arvutitehnika instituut
language
inglise