Ubar, R., Marenkov, M., Mironov, D., Viies, V.

full record print

Modeling sequential circuits with shared structurally synthesized BDDs

author

Ubar, Raimund-Johannes

Marenkov, Mihhail

Mironov, Dmitri

Viies, Vladimir

statement of authorship

Raimund Ubar, Mihhail Marenkov, Dmitri Mironov, Vladimir Viies

source

Proceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 2014

location of publication

Piscataway

publisher

IEEE

year of publication

2014

pages

p. 130-135 : ill

conference name, date

9th International Design & Test Symposium (IDT), December 16-18, 2014

conference location

Algiers, Algeria

ISBN

978-1-4799-8200-4

notes

Bibliogr.: 11 ref

TalTech department

arvutitehnika instituut

language

inglise

Märksõnad ja võtmesõnad

subject term

digitaalintegraallülitused

rikked

simulatsioon

keyword

sequential circuits

binary decision diagrams

fault collapsing

fault simulation

Ubar, R., Marenkov, M., Mironov, D., Viies, V. Modeling sequential circuits with shared structurally synthesized BDDs // Proceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 2014. Piscataway : IEEE, 2014. p. 130-135 : ill.