Fault simulation with parallel critical path tracing for combinational circuits using structurally synthesized BDDs
author
Devadze, Sergei
Raik, Jaan
Jutman, Artur
Ubar, Raimund-Johannes
statement of authorship
Sergei Devadze, Jaan Raik, Artur Jutman, Raimund Ubar
source
7th IEEE Latin American Test Workshop LATW'06 : Buenos Aires, Argentina, March 26th-29th, 2006 : proceedings
location of publication
Porto Alegre
publisher
Evangraf
year of publication
2006
pages
p. 97-102 : ill
conference name, date
7th IEEE Latin American Test Workshop LATW'06, March 26-29, 2006
conference location
Buenos Aires, Argentina
subject term
integraallülitused
rikked
kompuutersimulatsioon
otsustusdiagrammid
ISBN
85-7727-022-X
notes
Bibliogr.: 15 ref
TTÜ department
arvutitehnika instituut
language
inglise