BASTION : board and SoC test instrumentation for ageing and no failure found

author
statement of authorship
Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans Kerkhoff, Rene Krenz-Baath, and Piet Engelke
location of publication
[S.l.]
publisher
year of publication
pages
p. 115-120 : ill
conference name, date
2017 Design, Automation & Test in Europe (DATE), 27-31 March, 2017
conference location
Lausanne, Switzerland
keyword
No-Fault-Found
No-Trouble-Found
ISSN
1558-1101
ISBN
978-3-9815370-8-6
notes
Bibliogr. p. 119-120
TTÜ department
language
inglise
Jutman, A., Lotz, C., Larsson, E., Sonza Reorda, M., Jenihhin, M., Raik, J. et al. BASTION : board and SoC test instrumentation for ageing and no failure found // Proceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland. [S.l.] : IEEE, 2017. p. 115-120 : ill. https://doi.org/10.23919/DATE.2017.7926968