Impact of orientation on the bias of SRAM-based PUFs
author
Abideen, Zain Ul
Wang, Rui
Perez, Tiago Diadami
Schrijen, Geert-Jan
Pagliarini, Samuel Nascimento
statement of authorship
Zain Ul Abideen, Rui Wang, Tiago Diadami Perez, Geert-Jan Schrijen, Samuel Pagliarini
source
IEEE design & test
publisher
IEEE
journal volume number month
vol. 14, 3
year of publication
2024
pages
p. 14-20
url
https://doi.org/10.1109/MDAT.2023.3322621
subject term
orientatsioon
hoiakud
integraallülitused
riistvara
transistorid
pooljuhtseadised
keyword
Entropy
Random access memory
Integrated circuits
Layout
Hardware security
Transistors
Semiconductor device measurement
ISSN
2168-2356
2168-2364
notes
Bibliogr.: 12 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
https://www.scopus.com/sourceid/21100286806
https://www.scopus.com/pages/publications/85174806397?inward
WOS
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20DES%20TEST&year=2024
https://www.webofscience.com/wos/woscc/full-record/WOS:001209578000006
category (general)
Engineering
Tehnika
Computer science
Arvutiteadus
category (sub)
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
Computer science. Hardware and architecture
Arvutiteadus. Riistvara ja arhitektuur
Computer science. Software
Arvutiteadus. Tarkvara
quartile
Q2
TalTech department
arvutisüsteemide instituut
language
inglise