Impact of orientation on the bias of SRAM-based PUFs
author
Abideen, Zain Ul
Wang, Rui
Perez, Tiago Diadami
Schrijen, Geert-Jan
Pagliarini, Samuel Nascimento
statement of authorship
Zain Ul Abideen, Rui Wang, Tiago Diadami Perez, Geert-Jan Schrijen, Samuel Pagliarini
source
IEEE design & test
publisher
IEEE
year of publication
2023
pages
1 p
url
https://doi.org/10.1109/MDAT.2023.3322621
subject term
orientatsioon
hoiakud
integraallülitused
riistvara
transistorid
pooljuhtseadised
keyword
Entropy
Random access memory
Integrated circuits
Layout
Hardware security
Transistors
Semiconductor device measurement
ISSN
2168-2356
2168-2364
TTÜ department
arvutisüsteemide instituut
language
inglise