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From virtual characterization to test-chips : DFM analysis through pattern enumerationMartins, Mayler G.A.; Pagliarini, Samuel Nascimento; Isgenc, Mehmet Meric; Pileggi, LarryIEEE transactions on computer-aided design of integrated circuits and systems2020 / p. 520-532 https://doi.org//10.1109/TCAD.2018.2889772

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journal article EST / journal article ENG

Hardware trojan insertion in finalized layouts : from methodology to a silicon demonstrationPerez, Tiago Diadami; Pagliarini, Samuel NascimentoIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems2023 / p. 2094-2107 https://doi.org/10.1109/TCAD.2022.3223846 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
Seotud publikatsioonid 1
- Security-aware physical synthesis of integrated circuits = Integraallülituste turvateadlik füüsiline süntees
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Impact of orientation on the bias of SRAM-based PUFsAbideen, Zain Ul; Wang, Rui; Perez, Tiago Diadami; Schrijen, Geert-Jan; Pagliarini, Samuel NascimentoIEEE design & test2024 / p. 14-20 https://doi.org/10.1109/MDAT.2023.3322621

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Seotud publikatsioonid 1
- Leveraging FPGA Reconfigurability as an Obfuscation Asset = FPGA ümberkonfigureeritavuse rakendamine hägustamise vahendina
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Logic IP for low-cost IC design in advanced CMOS nodesIsgenc, Mehmet Meric; Martins, Mayler G.A.; Zackriya, V. Mohammed; Pagliarini, Samuel Nascimento; Pileggi, LarryIEEE Transactions on Very Large Scale Integration (VLSI) Systems2020 / p. 585-595 https://doi.org//10.1109/TVLSI.2019.2942825

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PCB design impact on GaN-Based converter operationHusev, Oleksandr; Jalakas, Tanel; Vinnikov, Dmitri; Vosoughi Kurdkandi, Naser; Persson, Eric2023 IEEE Applied Power Electronics Conference and Exposition (APEC), 19-23 March 2023 : proceedings2023 / p. 640-650 https://doi.org/10.1109/APEC43580.2023.10131547 Conference proceedings at Scopus Article at Scopus Article at WOS

book article EST / book article ENG

Number of records 5, displaying 1 - 5

1. facilities layout
2. Layout
3. layout patterns
4. Layout Synthesis
5. layout-based effects
6. space layout
7. warehouse layout

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