Hybrid BIST optimization using reseeding and test set compaction
author
Jervan, Gert
Orasson, Elmet
Kruus, Helena
Ubar, Raimund-Johannes
statement of authorship
Gert Jervan, Elmet Orasson, Helena Kruus, Raimund Ubar
source
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
location of publication
Los Alamitos
publisher
IEEE Computer Society
year of publication
2007
pages
p. 596-603 : ill
conference name, date
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, 29-31 August, 2007
conference location
Lübeck, Germany
url
http://dx.doi.org/10.1109/DSD.2007.4341529
subject term
integraallülitused
digitaalelektroonika
testimine
ISBN
978-0-7695-2978-3
notes
Bibliogr.: 16 ref
TalTech department
arvutitehnika instituut
language
inglise