Fault diagnosis in the BIST environment based on bisection of detected faults
statement of authorship
Raimund Ubar, Sergei Kostin, Jaan Raik
source
LATW2007 : 8th IEEE Latin-American Test Workshop : March 11-14, 2007, Cuzco, Peru
location of publication
[S.l.]
year of publication
pages
[6] p. : ill
notes
Bibliogr.: 16 ref
Ubar, R.-J., Kostin, S., Raik, J. Fault diagnosis in the BIST environment based on bisection of detected faults // LATW2007 : 8th IEEE Latin-American Test Workshop : March 11-14, 2007, Cuzco, Peru. [S.l.], 2007. [6] p. : ill.