Characterization of Interfaces Between the Metal Film and Silicon Carbide Semiconductor = Metallkontakti ja ränikarbiidi vahelise liidespinna karakteriseerimine
author
supervisor
statement of authorship
Mehadi Hasan Ziko ; [supervisor Ants Koel, co-supervisor Tamas Pardy ; Tallinn University of Technology, School of Information Technologies, Thomas Johann Seebeck Department of Electronics]
type of dissertation
doktoritöö
university/scientific institution
Tallinna Tehnikaülikool
location of publication
Tallinn
publisher
year of publication
pages
161 p. : ill
series
Tallinn University of Technology. Doctoral thesis = Tallinna Tehnikaülikool. Doktoritöö ; 52
subject term
subject of form
ISSN
2585-6898
ISBN
978-9949-83-763-2
notes
Includes bibliogr
Thesis (Ph.D.) : Tallinn University of Technology, 2021
Kättesaadav ka võrguteavikuna
Kokkuvõte eesti keeles
Autori CV inglise ja eesti keeles, lk. 160-161
url
TTÜ department
language
inglise
Ziko, M.H. Characterization of Interfaces Between the Metal Film and Silicon Carbide Semiconductor = Metallkontakti ja ränikarbiidi vahelise liidespinna karakteriseerimine. Tallinn : TalTech Press, 2021. 161 p. : ill. (Tallinn University of Technology. Doctoral thesis = Tallinna Tehnikaülikool. Doktoritöö ; 52).