Hybrid BIST optimization using reseeding and test set compaction
author
Jervan, Gert
Orasson, Elmet
Kruus, Helena
Ubar, Raimund-Johannes
statement of authorship
Gert Jervan, Elmet Orasson, Helena Kruus, Raimund Ubar
source
Microprocessors and microsystems
journal volume number month
32
year of publication
2008
pages
5/6, p. 254-262 : ill
url
https://www.sciencedirect.com/science/article/abs/pii/S0141933108000288
subject term
testimine
optimeerimine
ISSN
0141-9331
notes
Bibliogr.: 27 ref
language
inglise