High-level path activation technique to speed up sequential circuit test generation
author
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Jaan Raik, Raimund Ubar
source
European Test Workshop 1999 : proceedings, May 25-28, 1999, Constance, Germany
location of publication
Los Alamitos
publisher
IEEE Computer Society Press
year of publication
1999
pages
p. 84-89 : ill
ISBN
0-7695-0390-X
notes
Bibliogr.: 12 ref
language
inglise