EFIC-ME : a fast emulation based fault injection control and monitoring enhancement
author
Abideen, Zain Ul
Rashid, Muhammad Haroon
statement of authorship
Zain Ul Abideen, Muhammad Haroon Rashid
source
IEEE Access
publisher
IEEE
journal volume number month
vol. 8
year of publication
2020
pages
p. 207705-207716
url
https://doi.org/10.1109/ACCESS.2020.3038198
subject term
usaldusväärsus
emuleerimine
manussüsteemid
rikked
riistvara
turvalisus
paindlikkus
keyword
dependability
emulation
embedded systems
fault injection
hardware security
Opal Kelly field programmable gate array (FPGA)
flexibility
ISSN
2169-3536
notes
Bibliogr.: 28 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
https://www.scopus.com/sourceid/21100374601
https://www.scopus.com/record/display.uri?eid=2-s2.0-85097356103&origin=inward&txGid=2f1165cb9a49c99935e3d326b2af989d
WOS
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=IEEE%20ACCESS&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000595015400001
category (general)
Engineering
Computer science
Materials science
Tehnika
Arvutiteadus
Materjaliteadus
category (sub)
Engineering. General engineering
Computer science. General computer science
Materials science. General materials science
Tehnika. Üldine inseneriteadus
Arvutiteadus. Üldine arvutiteadus
Materjaliteadus. Üldine materjaliteadus
quartile
Q1
TalTech department
Thomas Johann Seebecki elektroonikainstituut
language
inglise
Reserch Group
Centre for hardware security