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1

book article

Accelerating transient fault injection campaigns by using Dynamic HDL SlicingBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore2019 / 7 p. : ill https://doi.org/10.1109/NORCHIP.2019.8906932

book article
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2

journal article EST / journal article ENG

Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
3

book article

Combining fault analysis technologies for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings2019 / p. 129–134 : ill https://doi.org/10.1109/ATS47505.2019.00024

book article
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
4

book article

Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568

book article
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
5

book article

Efficient fault injection based on dynamic HDL slicing techniqueBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 52-53 : ill https://doi.org/10.1109/IOLTS.2019.8854419

book article
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
6

journal article EST / journal article ENG

EFIC-ME : a fast emulation based fault injection control and monitoring enhancementAbideen, Zain Ul; Rashid, Muhammad HaroonIEEE Access2020 / p. 207705-207716 https://doi.org/10.1109/ACCESS.2020.3038198 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
7

book article

Machine learning to tackle the challenges of transient and soft errors in complex circuitsLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece2019 / p. 7-14 : ill https://doi.org/10.1109/IOLTS.2019.8854423

book article
8

book article

On the estimation of complex circuits functional failure rate by machine learning techniquesLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings2019 / p. 35-41 : ill https://doi.org/10.1109/DSN-S.2019.00021

book article
Related publications 1
- A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
9

book article

Representing gate-level SET faults by multiple SEU faults on RT-levelBagbaba, Ahmet Cagri; Jenihhin, Maksim; Ubar, Raimund-Johannes; Sauer, Christian2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings2020 / art. 19889351, 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159715

book article
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
10

journal article

SALSy : security-aware layout synthesisEslami, Mohammad; Perez, Tiago Diadami; Pagliarini, Samuel NascimentoarXiv.org2024 / 13 p. : ill https://doi.org/10.48550/arXiv.2308.06201

journal article
Related publications 1
- On the use of defensive schemes for hardware security = Kaitseskeemid riistvara turvalisuse tagamiseks
11

journal article EST / journal article ENG

SALSy: security-aware layout synthesisEslami, Mohammad; Perez, Tiago; Pagliarini, SamuelIEEE transactions on computer-aided design of integrated circuits and systems2026 / p. 1704-1717 : ill https://doi.org/10.1109/TCAD.2025.3607131 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
12

journal article EST / journal article ENG

A systematic literature review on hardware reliability assessment methods for deep neural networksAhmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, MaksimACM Computing Surveys2024 / art. 141, 39 p. : ill https://doi.org/10.1145/3638242 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
Related publications 2
- Assessment and Enhancement of Hardware Reliability for Deep Neural Networks = Riistvara töökindluse hindamine ja täiustamine süvanärvivõrkude jaoks
- Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
13

book article

Use of formal methods for verification and optimization of fault lists in the scope of ISO26262Augusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2018 Design and Verification Conference (DVCON) Europe : [proceedings]2018 / 6 p. : ill https://repository.tudelft.nl/islandora/object/uuid%3Adbd7f22d-0324-45f5-9180-8fe3fc95a9ce

book article
Related publications 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

Number of records 13, displaying 1 - 13

1. fault injection
2. Fault Injection Simulation
3. fault-injection attack
4. false data injection
5. false data injection attack
6. fiber-reinforced composites and injection molding
7. Gate Injection Transistor (GIT)
8. gating-aware error injection
9. ghost injection attack
10. injection molding
11. injection of technical water
12. manual hydrodynamic injection
13. power injection
14. reactive power injection
15. zero injection phase
16. AI-based fault detection
17. asynchronous fault detection
18. automatic fault diagnosis
19. bearing fault diagnosis
20. bi-directional fault monitoring devices
21. conditional fault collapsing
22. control fault models
23. critical path fault tracing
24. cross-layer fault tolerance
25. cross-layered fault management
26. extended fault class
27. fault currents
28. fault analysis
29. fault analysis model
30. fault classification
31. fault classification
32. fault collapsing
33. fault compensation
34. fault coverage
35. fault current and voltage measurements
36. Fault current limite
37. fault current limiter
38. fault detection
39. fault detection and classification
40. fault detection and diagnoses
41. fault detection and diagnosis
42. fault detection and diagnostics (FDD)
43. fault diagnosis
44. fault diagnostic
45. fault diagnostic resolution
46. fault diagnostics
47. fault dignosis
48. fault effects
49. fault emulation
50. fault equivalence and dominance
51. fault handling
52. fault handling strategy
53. fault indicator
54. fault Interruption
55. fault localization
56. fault location
57. fault management
58. fault masking
59. fault modeling
60. fault models
61. fault monitoring
62. fault prediction
63. fault protection
64. fault redundancy
65. fault resilience
66. fault ride through
67. Fault ride through enhancement
68. fault seeding
69. fault signal
70. fault simulastion
71. fault simulation
72. fault simulation with critical path tracing
73. fault tolerance
74. fault tolerant
75. fault tolerant computer systems
76. fault tolerant control
77. fault tolerant operation
78. fault tolerant router design
79. fault tolerant systems
80. fault tree analysis
81. fault-plane solution
82. fault-resilience
83. fault-resistant
84. fault-ride-through (FRT)
85. fault-tolerance
86. fault-tolerant
87. Fault-tolerant (FT) converters
88. fault-tolerant control
89. fault-tolerant converter
90. functional fault model
91. high-level control fault model
92. high-level fault coverage
93. high-level fault model
94. high-level fault simulation
95. high-level functional fault model
96. hybrid fault detection
97. Katun fault
98. low-level fault redundancy
99. no fault found
100. No-Fault-Found
101. open circuit fault
102. Parallel Fault Simulation with Critical Path Backtracing
103. parallel fault-simulation
104. photovoltaic fault detection algorithms
105. PV fault classification
106. short circuit fault
107. spectrum-based fault localization
108. stacking fault
109. stuck-at fault model
110. test generation and fault diagnosis
111. transient fault mitigation
112. transmission lines fault

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