Hierarchical approach to test generation for digital systems at system, circuit and defect levels
author
statement of authorship
R.Ubar
location of publication
[Ilmenau]
publisher
year of publication
pages
S. 711-716 : Ill
notes
Bibliogr.: 8 Tit. Tiitellehe pöördel ISSN 0943-7207
Ubar, R. Hierarchical approach to test generation for digital systems at system, circuit and defect levels // 45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband. [Ilmenau] : Technische Universität Ilmenau, 2000. S. 711-716 : Ill.