Test configurations for diagnosing faulty links in NoC switches
statement of authorship
Jaan Raik, Raimund Ubar, Vineeth Govind
location of publication
Los Alamitos
publisher
year of publication
pages
p. 29-34 : ill
conference name, date
12th IEEE European Test Symposium ETS 2007, 20-24 May, 2007
conference location
Freiburg, Germany
ISSN
1530-1877
ISBN
978-0-7695-2827-4
notes
Bibliogr.: 17 ref
TTÜ department
language
inglise
Raik, J., Ubar, R.-J., Govind, V. Test configurations for diagnosing faulty links in NoC switches // 12th IEEE European Test Symposium ETS 2007 : 20-24 May 2007, Freiburg, Germany : proceedings. Los Alamitos : IEEE Computer Society Press, 2007. p. 29-34 : ill.